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NMX-J-191
% Y3 O- F6 f& QHeat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical
% P( M' @8 c, m$ J7 o* @, ?$ pConductors – Test Method
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5.1.3 Deformation
, f, T& J$ {, @5 k6 V; x5.1.3.1 Insulation
- R( i; g; E' l8 U7 }The insulation on single-conductor wires, and on the individual conductors (separated, in the case of
: W2 X- j$ ?" P2 s+ {parallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a
# j$ U6 d& |! x! |- O' omass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.# P( t; q# n- |7 t8 S" Q9 s# j0 ]% ] I
5.1.3.2 Jacket
: u' U5 e! A3 w/ l+ y9 c' NSmoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in
Q }' m2 z9 b; e0 sthickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature7 z4 z' \: F, \' }# k9 Z
shown in Table 40 for 1 h.
% D" R% @! |8 L5 S" _" F5.1.3.3 Method
. N8 ^& {0 M* I; }9 HCompliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method
) m" a7 e' D; L1 R9 Y( e4 I; tdescribed in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.
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UL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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