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IEC (EN) 61347-2-3 - Year 2004
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GB-19510.4-2009" u3 s# s( z# G( f+ N: l" T
http://www.angui.org/read.php?tid-65084-keyword-19510.html
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' D$ d7 A/ |% M7 R/ r$ VClause 17.1
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+ u$ L1 m, Q; r8 n; z7 z* d17 Behaviour of the ballast at end of lamp life- L+ ` X6 \# G# j
3 z% ]: P4 H. N m* j17.1 End of lamp life effects
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$ p1 z! e* h3 k4 N8 QAt the end of lamp life the ballast shall behave in such a way that no overheating of lamp cap(s occurs at any voltage between 90% and 110% of the rated supply voltage.. U' j, T+ u# z# A
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For the test simulating end of lamp life effects, three tests are described: 4 }. ?9 P6 }4 |% a) e& ~- ?
a) asymmetric pulse test (described in 17.2);$ V) K" A% Q* N0 r
b) asymmetric power dissipation test (described in 17.3);
% A9 U0 A% ^/ l3 K* A' Xc) open filament test (described in 17.4).
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Any of the three tests may be used to qualify electronic ballasts. The ballast manufacturer shall determine which of the three tests will be used to test a given ballast based on the design of that particular ballast circuit. The chosen test method shall be indicated in the ballast manufacturer’s literature." @, S0 W% f* P8 w. ^
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NOTE Checking ballasts against their capability to cope with the partial rectifying effect is recommended by IEC 61195, Annex E, and IEC 61199, Annex H.' d ]; T6 q: c7 O
Lamps used in the ballast test circuits shall be new lamps seasoned for 100 h. |
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