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各位大神,
, T. P/ m/ T4 ^) ]/ ^( \ 大家是怎么理解UL1598这18.16段话的?(我用红色标识了)
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3 \/ x }! f" S- j- ~18.1 Dielectric voltage-withstand! M1 `- N# g8 u+ r) }
18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.
1 h! i1 P9 h% V18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied3 E) f) \; ~3 V
between live parts and accessible non-current-carrying metal parts, including parts accessible only during
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18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice
+ V( ]2 W+ h9 Z4 r7 ] y$ g3 dthe rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at; j* ]4 Q; {7 l2 s9 ~
1.414 times the AC potential denoted above.
$ T, s( ?8 c7 Q18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required3 u5 p3 j( ?5 A- ?1 O5 q
test value is reached or breakdown occurs. During the test, any switches or other controls shall be in the6 I9 d1 n4 l/ A% @
ON position.
5 e& e, e5 S+ ], F0 s) G/ {18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or2 N* N+ u! R w: R" Y2 R9 V
decorative parts not likely to become energized shall not be required to be in place.
8 L2 ?8 v$ n5 t- R18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can) O4 h- [) A9 ?- c) O% B: D
be damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be v5 N0 c/ {$ Y
rearranged for the purpose of the test to reduce the likelihood of solid state component damage while
/ [6 w/ N2 U" C6 |2 J( l1 Z3 uretaining the representative dielectric stress on the circuit.$ _ t; ^8 t8 k$ `- f
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