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各位大神,
/ S$ b+ l6 U, ^0 v 大家是怎么理解UL1598这18.16段话的?(我用红色标识了)
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18.1 Dielectric voltage-withstand
: X- }8 Y& e b) T0 @# ~- ~) R18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.! A/ K8 T$ Q' U1 _
18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied0 C' [/ Q8 j+ O: ^2 y$ f t9 |0 p
between live parts and accessible non-current-carrying metal parts, including parts accessible only during4 h3 z8 I2 H' V. e# i# m. O* F
relamping.8 Z+ e. v2 m2 `& m0 s* l! i
18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice
) ^( c) L2 c$ H9 } P' J- Cthe rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at
" U0 A) L/ Y: C' j6 I0 D1.414 times the AC potential denoted above. D% h+ P$ H6 i. f! q
18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required
7 S8 E' |( j5 ?9 ^test value is reached or breakdown occurs. During the test, any switches or other controls shall be in the, f# g P. W5 @. o3 K
ON position.
3 w# C i3 T* o8 Y4 R# y( [18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or
" S c7 r& P+ a( F5 \decorative parts not likely to become energized shall not be required to be in place.7 |% ~ x& ^( h% @* G+ F
18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can
% ~) y4 Q5 Z+ Fbe damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be6 J: v7 ?- @ L' W
rearranged for the purpose of the test to reduce the likelihood of solid state component damage while- e* F$ H( t& ^, y) i1 Q, G
retaining the representative dielectric stress on the circuit.$ w* a% ~ q0 w" I+ C& \
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