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本帖最后由 chinatown 于 2017-1-7 11:25 编辑
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Question; Y, {& {% M+ u( ?$ p
How many samples shall be subjected to the individual type tests according to clause 6.2 of IEC% ~: g q: W9 S0 I' w6 Z
60831-1 for shunt power capacitors?: G7 g( C) z6 N% Z. {3 B2 {
Decision; e: C+ |1 l% Y+ W9 @% P. H$ o* _2 m
For the performance of a type test on shunt power capacitors according to IEC 60831-1 the following
7 K! b3 q9 i0 e1 d. a" f8 ]5 Otype test schedule shall be applied:7 z0 o! ~ V& B& [
Type test schedule:
, |/ D! z* F! W! T# yTests Subclause Number of samples to be inspected
5 A3 P' R1 O, i& o# o: jSingle-phase/ n2 ~/ q* C% j
units
% \3 ]1 O2 D* z. l+ aThree-phase units( ]6 y: Z& P/ Y ~1 c- G. a
≤ 10 kvar > 10 kvar
6 E) i- p! s ^- G- Y* L6 s4 ~, TThermal stability test 13 1 1 1" I1 j/ [: ] r0 k( ]
Measurement of the tangent of the loss angle (tan δ)) W& J& b# d$ K$ U
of the capacitor at elevated temperature
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Voltage test between terminals 9.2 5 5 3- L, y* Q( R1 L; Z
Voltage test between terminals and container 10.2 5 5 38 J% N4 @5 o& j; N: k/ h) r9 W% i/ ^" T
Lightning impulse voltage test between terminals and
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15 5 5 3& m; X6 q* m9 r0 r4 U! B
Discharge test 16 3 3 3! X! C- m# C2 P: ]/ Q
Ageing test 17 5 3 2
0 P1 y5 C4 T5 n+ DSelf-healing test 18 5 3 3
& M( H* e, k9 O+ \Destruction test 19 5 3 2
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发表于 2017-1-7 11:22
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