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Question
" F' W, [( Q P: Q- n( rThe first sentence of clause 3.4.3.1 of IEC 60384-14 states: ”Capacitors of each technology, rated
" k6 y; s- A8 l B( Bvoltage, class and sub-class shall be separately qualified”.
* y0 L' V+ J7 V5 m/ O* DIf it is requested to qualify a dual-class X/Y capacitor (e.g. X1:400 V, Y2:250V), is it permissible to
' I5 r) I( T( D% v- Operform one type test only by applying for each individual test the highest test severity?
- q2 S8 ]# T5 l6 p, ~) aTo qualify a dual-class X/Y capacitor, testing laboratories may have different interpretations of this, k1 Y% _3 p* i! ^0 o/ [ R
sentence.
) |% ` Q! H0 G4 n1 A3 A. OInterpretation a): Some testing laboratories test the same capacitor series once for X1 and once for0 \/ c, h- ?' ]5 c4 N5 @4 B
Y2 at the same time in separate type tests.* d: ~7 V7 v# @' D& R8 N4 G/ v
Interpretation b): Other testing laboratories follow the opinion that the safety of the capacitors is also( K2 T0 e8 f& }; O3 O3 I3 U, R9 L
assured if a mixture of highest testing (peak) voltages of both sub-classes is used. This means worst
1 H h% y- @! u+ Ocase testing, covering both sub-classes for certification.$ j5 K# T* p$ B# r9 |# X: [- }
Both interpretations may possibly lead to the result of compliance or non-compliance of the capacitor,
9 `. U' u6 ] y: Eas in a) more samples are tested and in b) a single capacitor is more stressed.
& {( q! m' a2 V0 O# |0 AFrom the technical point of view, it should be acceptable to perform one type test only by applying the! M) s1 E; }* O" J
highest test severity for each test.
1 C; } w6 U; }! P! J" `0 aDecision( f6 _# s: ~% f, ]4 r/ E& [4 ]
When a range of dual-class capacitors (X/Y) is qualified, it is allowed to perform one type test only, if) ~5 ~0 g: e" z: O# W
the highest severity of the X or Y class is applied in each respective test.
2 r- g# k# J/ ]1 E( Y0 z/ @! Z- w$ B1 T
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