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Question
# b- P9 ^4 s4 o( j& ~! Z' TIn which way shall the temperature rise test be carried out on a device composed of two or more
, Q6 P( V. `9 _+ c: O8 [switches, having the same or different pattern number mounted on a common body? X% H$ v' v3 t
The construction is allowed in note 1 of sub-clause 7.1.1, but the testing conditions are interpretable
+ P4 V [# c' X1 I! U2 ?& }& zin different ways in clause 17.1.
# I$ F# m5 Q1 _& l2 lDecision
% a0 h; n* e/ O% PThe temperature rise test shall be performed separately on each individual switch on condition that it* p, {& s. e* W9 ]% t0 a
is a single-phase switch.9 ]- c! k8 w6 U, s1 g" f7 m# @
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1 ]2 s$ P% f( P# s; x+ ?/ U$ t; ~9 u5 c9 M" t% O
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