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Question) s) k. Z# L3 T8 x+ [4 c8 i$ j- C
In which way shall the temperature rise test be carried out on a device composed of two or more% z4 d. n' n+ M+ H/ B4 v2 ~6 o9 F
switches, having the same or different pattern number mounted on a common body?2 C7 z+ h1 q* [4 X6 M; j3 E9 ]
The construction is allowed in note 1 of sub-clause 7.1.1, but the testing conditions are interpretable5 f3 r j9 [/ c& Z8 b1 J9 N
in different ways in clause 17.1.
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The temperature rise test shall be performed separately on each individual switch on condition that it# n( K7 y" `8 [: ~
is a single-phase switch.) s* Z: r8 d# w
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