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jsspace 发表于 2016-10-11 11:34
?8 D8 m# v$ i+ s6 [0 b. o2 \漏液不可以接受,不管是否灌胶。 9 ~7 r9 S, f+ ?; p4 l! X
, [6 q; y) w9 N! X8.7.1.2 After ultimate results have been obtained for each test, the sample shall be permitted to cool to# L- ]. k2 i0 G" F9 i9 H% D
room temperature and the dielectric voltage withstand test of 8.6 shall be repeated.
+ s7 k! e+ J% S4 M$ H4 e$ f0 k$ I, F8.7.1.3 A risk of fire or electric shock is considered to exist with any of the following results:
1 V/ _! h5 Z- }# ]! Q6 _: j7 @a) Opening of the ground fuse,9 U, v4 t) V0 \( p8 Q( m/ \
b) Charring of the cheesecloth or tissue paper,
. O" k6 v; K- t6 h, G$ l5 pc) Emission of flame or molten material from the unit,
* H( t3 |' J9 `6 H" g9 od) Ignition or dripping of a compound from the unit,4 A |& C+ y# ]. t7 [7 m* d
e) Exposure of live parts that pose a risk of electric shock under the requirements for! R5 D; f) l6 l
accessibility of 7.2, or5 }# t& E8 i. m7 N
f) Breakdown during the subsequent dielectric voltage withstand test.( t7 u1 G' {. m" z1 c
Opening of the 20A time delay fuse is acceptable provided none of the other conditions noted in (a)3 h2 ?) o/ w) W- A5 Y6 o1 f9 X
through (f) occurs.9 u9 M) g3 c" e1 k8 ?; k
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8.7.2 Component failure test
$ F; K& f& j: V5 a8.7.2.1 A unit having components such as resistors, semiconductor devices, capacitors, and the like shall/ j$ S: K8 z: S! Q( z* c
not exhibit a risk of fire or electric shock when a simulated short circuit or open circuit is imposed. In
) c& c% [8 b" }# Vpreparation for component failure tests, the equipment, circuit diagrams, and component specifications
6 a) k# C/ E0 u3 O% h0 `! L3 |are examined to determine those fault conditions that might reasonably be expected to occur. Examples
( Y* R- R0 C( O* j+ ~( y; w. t9 Cinclude: short-circuits and open circuits of semiconductor devices and capacitors, faults causing open- T: f* t7 N& L" b: P
circuits of resistors and internal faults in integrated circuits." j) g1 g/ f9 t* B9 r# r6 m6 F$ [
Exception No. 1: Circuits in which maximum power levels have been determined to not exceed 50 W need
! B8 J7 F9 X) N/ ?3 `not be evaluated for component failure.+ z# @. u+ ^; ]8 V4 y7 H; n
Exception No. 2: Devices supplied by a source operating within the limits for risk of fire and electric shock5 a- }# f3 d' t9 F! @4 b
need not be subject to this test.: G# G% [; ]' W) M
8.7.2.2 Each component is to be short circuited or open circuited, one at a time (one fault per test). Each
- W; t D6 ~/ W2 K4 P% ztest shall continue until either the unit is no longer operable, or until conditions are obviously stable (as
; ]/ g2 s! ~9 h1 Sdetermined by no visual.4 c+ T B* Q4 ^
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, i5 k# _. g* c" h0 E* J) T再核对一下标准看有没有答案?0 p1 R, @, E; j
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