|
不好意思,贴错图了,应该是这段话' O, X1 o: e' J% x' c n
D.1.5 A device employing a solid-state component that is not relied upon to reduce a risk of electric shock
5 O+ a1 R/ q& P% c6 U1 {. B$ kand that can be damaged by the dielectric potential may be tested before the component is electrically1 E- A( x5 m, s2 j. V1 }! q
connected provided that a random sampling of each day’s production is tested at the potential specified
# y1 h3 v/ L" Z8 v: k8 B5 Din Table D.1. The circuitry may be rearranged for the purpose of the test to reduce the likelihood of# Y* @6 A- s9 q
solid-state component damage while retaining representative dielectric stress of the circuit.
1 W, [7 o4 E9 Z! u3 l9 F8 f |
|