DSH 659 Problem of setting a current applied to ACB of high current rating in in

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DSH 659 & I. r) }0 I  m. Y% K

Problem of setting a current applied to ACB of high current rating in instantaneous tripping ; c  `( f2 }6 k

8.3.3.1.2 % @; @: ?3 x1 M- M* k& }( s" b+ y

60947-2(ed.4)

  n# i9 C/ |1 q2 F# Z3 `Standard-
IEC 60947-2 (2006-04, 4th Ed.)
Sub clause(s):
8.3.3.1.2
Sheet:
5 d& D2 a2 Y* Y& l# X' P% XDSH 659
$ [1 C/ s# |0 L- U# pSubject:
Problem of setting a current applied to ACB of
high current rating for instantaneous tripping.
Key words:
; P6 X' w6 X0 T9 @. S  [Trip limits &
characteristics
" n1 F' e/ u  ^% y6 M  G; `( |* d7 aApproved at
* z2 Y+ }1 W# h6 [; ?+ P$ k% \the 45th CTL
Plenary
. E7 N' y  ?! gMeeting in
Prague in 2008
, ~- p  q' ?2 n  f$ Q1 @4 W! hQuestion:
7 ?- A0 n9 `9 a, iAccording to 8.3.3.1.2, when the over-current opening release is a built-in part of the
circuit breaker, it shall normally be verified inside the corresponding circuit breaker.
" z& e5 N! n' q4 @7 B4 U! }5 pFor example, in case an air circuit-breaker (ACB) has a rating of 6300 A with an
instantaneous trip release up to 16 In, do we have to apply 80640 A (16 In x 80 %)
and 120960 A (16 In x 120 %) to the main circuit of ACB by use of a high power
testing facility when performing the trip test of SEQ. I?
" @+ {, j! z3 W4 Z: I1 lRationale:
It is not so easy to conduct the instantaneous trip test using the high currents
mentioned above, because to do so a high power testing facility is required. In
addition ACBs often have several ratings, which are determined by the specification
of the CT in combination with the trip unit, and the trip unit is usually the same for all
models.
So some accredited testing laboratories have performed this test by applying the
, Q1 G; _" m* M# j9 Vsecondary current of CT (normally 5 A) to the input of an overcurrent release. This
' z( B% [0 K' p+ d+ Nrelease is connected to operating mechanism of contacts to check the mechanical
/ U3 _# M0 \1 S( P- Dopening of an ACB. But by use of this method, we bypass possible problems such
as CT saturation, thermal and EMC influence on ACB, especially on single-pole
connection.
$ C1 s  _0 ^2 }+ B. WDecision:
& m- U* H  y* x) K7 v. iThe secondary current of the CT (reduced current, 5 A, for example) may be used
' {; z( ?1 {  w% c- Ufor trip tests of ACBs integrated with electronic OCR for all ratings of In, but only for
' A3 Y- {* O: Isub-clause 8.3.3.1.2 of SEQ I.
( \! J3 ~1 C* G  \) k9 tBut in addition, followings items shall be verified to fully cover the safety aspects of
' a+ P& }$ v& ythe standard:
# z. A! O* o# a0 j% w# j1. The conformity of the performance (at least turn ratio and composite error)
! c  C. y; w9 |% H3 w& A5 k5 Bof the CT or Rogowski coil, if any, shall be verified by specifications, test
: o7 [. c3 h- C# ?reports or certificates. All CTs of the circuit-breakers of the given frame
( W+ w' B, F  o( [; Z* P+ \size have to show the same performance characteristic.
3 B# p- ]& y  _" B& n2. The single pole short-circuit test with a current equal to 80 % of the
maximum current setting of the instantaneous release and equal to 120 %
of the maximum current setting of the instantaneous release shall be
; \7 k5 X0 j0 [! Gperformed at any convenient voltage with the current in the main poles of
the circuit-breaker. The other tests required by the standard may be
. j8 x! y8 P* \0 |7 c9 N2 V0 D8 Qconducted by use of a simulated input signal to the tripping unit.
, R# G9 b) u8 U
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