|
| DSH 4055 i5 g# H4 [( q6 K) l# g$ {1 P+ n
# I, O0 F9 K# o7 o5 n. q
| Leakage current in secondary circuits
0 b0 T5 k9 x n8 A' y1 u; J2 l | 17g)
2 |, ~& \9 s, s | 60601-1(ed.2);am1;am2/ {2 r3 d/ ?. i+ p& p- N' t
| ; K& U- N8 s) I8 t' Z1 S u9 L
Standard(s)- (year and edition):& G" G7 H, U4 \( @) p2 g" r5 @
IEC 60601-1:1988 Ed.2 Am1+Am20 G( u; {( G( ~$ M# P( \
Sub clause(s): 17 g)
( _* E/ t7 E" e9 i8 `$ |Sheet n°: DSH-405
3 ~ s: E7 V7 `Subject: Leakage current in secondary circuits3 b+ Q. [7 s, D
Key words: Leakage current, secondary circuit2 Y0 Y* t( o6 o/ F, Z4 V2 A/ Z8 T
Confirmed by CTL at its 39th meeting, in Cologne: X9 O' g2 m. Y0 `( E* E3 h
Question:
2 a6 h- v' d" F9 aIf secondary circuit impedances limit the leakage current, is further investigation of secondary
6 {! _7 i! o# Ocircuits required? (refer to sub-clause 52.5).
8 ~! U1 x3 _ Z8 ?6 _0 a- iDecision:4 S1 O3 V0 M, h K
Secondary circuits providing protective means after short-circuiting of inadequate AIR
) l1 b Q% W- v5 N; t# nCLEARANCE and CREEPAGE DISTANCE must be investigated. Failure of components in
|" W) d, O8 I) d7 ]( x5 {& ]these circuits shall be investigated as a SINGLE FAULT CONDITION. Failure of such9 K8 t1 N: \( A
components shall be investigated as a SINGLE FAULT CONDITION.
. [2 Z4 n: F9 D2 b6 `4 u8 Z
* m1 z$ \* T" t1 v2 X6 e6 R' Y
0 w1 ?7 ^( }3 y+ G. f/ d6 {$ ? |
本帖子中包含更多资源
您需要 登录 才可以下载或查看,没有帐号?注册安规
x
|