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DSH 3027 H& q7 D3 y& M3 u- L# U) i! g
| Capacitance
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| 61010-1(ed.1);am1;am2
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; i" Q; P0 i8 E- [6 VStandard:: r9 t3 a7 C/ J$ A3 u
IEC 61010-
7 N, P4 j% ?; x) W% t& }9 p1:1990+A1:1992+A2:19958 I8 N# a, e3 Q; U% k, {
Sub clause:
% O, R; x9 Q: h0 H& [6.3.1.3
# c, C( V1 a5 R/ a; l9 RSheet n. 302
j1 V# A. ?2 V+ n, O v# L/ xPage 1(1)
) a3 e! o% n* g }9 {1 C# K4 B5 ESubject:
! b5 ^ z& e0 u; N, \+ mCapacitance8 H, b! k6 f* H" p& ^
Key words:4 Q& j5 n0 @" V4 N7 D& Y% Q
- Capacitance# X' _$ I7 @! V% }
- Charge
: c( b+ ^; L+ p' `7 `+ oDecision taken by
' M. k& I7 E- o7 j* ^% WETF3 and confirmed
/ Y8 J) r: `( i; q' Z* `0 n" {by CTL at its 38th6 R9 z2 o" J3 v" ]9 ~
meeting, in Toronto+ t. X9 }2 z, w' A
Question:9 I9 w3 C+ c: z, I
How can the stored charge be measured, in particular where the circuit is complex?, \. _; ]! K' u. R: v: K
Decision and Explanation:8 ] T+ I0 V$ {+ K" D I
Only the charge accessible to the user is of concern under the standard. Therefore, where the
4 G/ f$ V: L. I- c' U1 Ncircuit is complex, it is considered that a method of measurement from the accessible part is) {; X! Z1 Q( g) X- V
needed. It is, therefore, recommended that a procedure of discharge through a defined
' k* r3 K" B$ Q7 I) C/ x$ B; Presistor is used, monitoring the voltage – time profile to provide a method of calculation of% y+ y* o6 g' {2 c' a. f6 _4 V
charge.. J( t; U' w! x4 B) l
When this method is used it is requested that details are recorded in the report for the benefit9 ?4 H* a+ a' H" h( s
of CB members.
6 E3 ]5 D' {$ S2 FThe method described in IEC 60950 Subclause 2.1.10 is recommended.
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