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| Capacitance
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| 61010-1(ed.1);am1;am24 `1 x% N( i: a$ A2 n% W7 G
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" r. r1 Y/ E1 w2 @8 U( V3 C; p5 mStandard:1 l. P8 J/ {% [% |" I6 Z
IEC 61010-
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Sub clause:2 t$ e* ^1 s' _; b
6.3.1.3 o/ j. E. f" M' e5 g
Sheet n. 302
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Subject:
, b8 h2 Q" v% DCapacitance
" V6 `, Q; P: WKey words:
- K* B: ^; b! I! o- Capacitance# U" ~: E" m" s1 g# z- A* v
- Charge
- p6 X3 S! `9 R% C9 @7 CDecision taken by6 A& s) `+ P* f0 V5 c. ?7 y: P9 l
ETF3 and confirmed
# j5 t* P7 z. Z; [2 j. Aby CTL at its 38th
1 S" y& L5 y& f3 u* H3 c. c0 e" vmeeting, in Toronto' l7 ~/ S$ t+ Y$ t8 H: w1 r" G
Question:3 q% C( g$ i1 Q+ Q7 ^3 E
How can the stored charge be measured, in particular where the circuit is complex?8 ?1 i, C+ g; j) d( `% q) W( H
Decision and Explanation:
* e$ V: _1 T. Z% ]0 L, h- ~Only the charge accessible to the user is of concern under the standard. Therefore, where the
& U K; t* i8 k/ f- E. e4 R1 scircuit is complex, it is considered that a method of measurement from the accessible part is
7 X2 h) A9 B) h' D& jneeded. It is, therefore, recommended that a procedure of discharge through a defined7 ], ]6 ]# V* x) k/ P1 ?6 s2 [
resistor is used, monitoring the voltage – time profile to provide a method of calculation of
& Z4 |; h$ W: u% Fcharge.
" v n- p6 f) l2 jWhen this method is used it is requested that details are recorded in the report for the benefit- d3 o' h. v- U' C! q
of CB members. j+ f, J! W" j! x$ v8 O6 j
The method described in IEC 60950 Subclause 2.1.10 is recommended.
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