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各位大神,; _$ g" E( K ?. o1 d3 P/ w7 A
大家是怎么理解UL1598这18.16段话的?(我用红色标识了)9 C/ z K2 {. H! J
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18.1 Dielectric voltage-withstand
) _5 D _ _( m# u1 U18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.
1 ?" I+ a7 `' t) [# t' M18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied
f0 c' S9 k u- i" e4 f" ibetween live parts and accessible non-current-carrying metal parts, including parts accessible only during
4 K5 @! W' V. U" p* |; L- B, erelamping.
& H$ y: U5 {( x- c18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice
8 a9 w& U) S. F) O5 G# Sthe rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at
2 s9 @! z% o; O) y3 C- r: j7 M1.414 times the AC potential denoted above.8 O. ]' `$ }4 l2 H- ?/ z6 j( L( Z
18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required0 t$ Z; v. h8 U ]2 Q7 X; r: `' l, w
test value is reached or breakdown occurs. During the test, any switches or other controls shall be in the
7 R, ^0 s- I5 ~& ]5 \ON position.
r* g/ p! A f18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or" }* X9 y9 `$ _6 N1 m; J
decorative parts not likely to become energized shall not be required to be in place.; T R8 y7 j$ n8 W3 r6 G+ j
18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can8 r1 U L& @4 M* E! E! e7 h4 h- Z
be damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be: Q) e4 p9 X/ [+ T, {! f
rearranged for the purpose of the test to reduce the likelihood of solid state component damage while9 ?2 V' c/ G8 ]. G4 [' w* @
retaining the representative dielectric stress on the circuit.8 `& L3 ? K* M/ o9 ~! g) Q7 H
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