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( y! \/ ^4 K; G& F+ l
( R% o& Z4 w# z( ] | Capacitance0 L9 _4 F1 ]2 A/ S
| 6.3.1.3
" `% I$ ]/ b$ f; z; l3 O | 61010-1(ed.1);am1;am2/ H. V1 m, f% r @" g" J! j
|
5 Q3 h8 Z4 L( |- ~; i, Q
" V, F& I C+ m2 w8 z
Standard:
7 R& U0 \6 ^7 }+ G- ~4 \9 nIEC 61010-" @' |3 }) ]; H5 ~
1:1990+A1:1992+A2:1995: s3 W( n- @+ q+ x& k2 b `% f
Sub clause:
0 A$ _! L5 Z: B! g {/ W! J6.3.1.3$ q7 y9 \! o8 d$ U& G
Sheet n. 3021 o' B' T3 v. n. m4 T) X( ^2 i
Page 1(1)
4 N. \( n5 P, y- r1 kSubject:
, Z! w2 o5 Z; R% _Capacitance
0 F4 Q3 ]' p) b% O' d2 QKey words:/ p: m1 {& {. ?. r' f' y
- Capacitance
$ I% R! ]! P) h6 w/ m- Charge0 f7 w1 \- }) v- X0 D. H
Decision taken by2 ]9 y0 w* D8 P3 ?9 Y
ETF3 and confirmed
8 g; X* l' ?, u* y$ b3 W* t2 pby CTL at its 38th5 o. Z4 L0 p1 \3 W; @, g
meeting, in Toronto3 ?. d: j# ~" \5 ^5 Q
Question:
2 ?- `) q! I8 d. X- O. r" [7 q. w6 EHow can the stored charge be measured, in particular where the circuit is complex?
3 u1 q; y4 P. K0 Q) P: p! uDecision and Explanation:3 G5 |( J- l/ L( u8 y
Only the charge accessible to the user is of concern under the standard. Therefore, where the9 @* I- K3 ^! z; k' g. u. S$ H
circuit is complex, it is considered that a method of measurement from the accessible part is
( K7 l4 |, s9 t. ]needed. It is, therefore, recommended that a procedure of discharge through a defined- V5 \2 V1 K* d- s( P
resistor is used, monitoring the voltage – time profile to provide a method of calculation of. {9 B1 Y7 C2 w, p
charge.
1 Z! c* L6 R$ pWhen this method is used it is requested that details are recorded in the report for the benefit
3 x) T# K# q& Iof CB members.3 T. }" K: E+ e" u
The method described in IEC 60950 Subclause 2.1.10 is recommended.2 s! Z b. r! T# ?5 K
. q, e: L8 q6 l! @4 w" B j
$ f& F: t4 Q8 M7 ]+ B% s
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发表于 2012-9-19 15:03
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