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各位大神,
- |8 A6 V% N5 X d* Q8 q 大家是怎么理解UL1598这18.16段话的?(我用红色标识了)
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18.1 Dielectric voltage-withstand
% [2 [; N5 F Q18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20. V; d. ^( x% `8 C
18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied6 B$ A$ ?2 h% n O0 |
between live parts and accessible non-current-carrying metal parts, including parts accessible only during% d5 E: J- S! E8 ]7 \
relamping.
H- _! u4 i' y& e. h! t18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice6 P$ ?9 N& z& ^/ W6 \: `. V
the rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at
) ~8 T2 b) M4 ^$ x1 \4 \* R3 }4 Q1.414 times the AC potential denoted above./ \1 n0 Z- S* a0 t w3 o! |
18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required
5 M( _# C# T6 Y- d: E: _8 p7 {test value is reached or breakdown occurs. During the test, any switches or other controls shall be in the# b/ a2 d1 q d% Q b
ON position." S2 o8 r! V4 L& k7 r3 h. d
18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or" x) ?( [# t2 R9 v5 r7 l- }# t
decorative parts not likely to become energized shall not be required to be in place.: O3 }; Q' J, z$ L. y9 |
18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can9 }4 o1 I+ Y I
be damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be
! }& v+ L( { P# n$ ]1 _5 krearranged for the purpose of the test to reduce the likelihood of solid state component damage while4 v/ L' G+ R5 _* d/ R0 V. O. K7 e
retaining the representative dielectric stress on the circuit.- z, \4 j- q2 t
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