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本帖最后由 chinatown 于 2017-1-7 11:25 编辑 ; @& D# N/ \) `2 y& w1 l- ]
/ q9 m/ J) t2 j$ h. I" qQuestion' ?; z! W0 }" ^5 L- A
How many samples shall be subjected to the individual type tests according to clause 6.2 of IEC% r# h' {: D" `/ f
60831-1 for shunt power capacitors?" ^5 {" [4 J% v3 t- P. ]
Decision
( H9 C$ w5 f# K7 ~; lFor the performance of a type test on shunt power capacitors according to IEC 60831-1 the following7 k* ?6 Z* J1 i9 ]. ~
type test schedule shall be applied:* ` }% n. p* [4 M) O
Type test schedule:
* D( Y) d$ P$ E! S0 b+ L) E$ JTests Subclause Number of samples to be inspected! @. J2 e# c, b3 I3 f
Single-phase
6 a) W' n- f! [# N1 Ounits: n5 y! \' h' Z9 a( M& B# `0 r. Y
Three-phase units: q0 l/ R, ~6 B, Q7 N% X
≤ 10 kvar > 10 kvar
, h2 p+ C( y% jThermal stability test 13 1 1 10 ^9 h( G5 B8 f' a8 ~
Measurement of the tangent of the loss angle (tan δ)* K( s8 ]1 H3 B
of the capacitor at elevated temperature
* O; Y+ `7 W; F# j0 w1 n1 H! R14 1 1 1* b! \3 S! u3 J" I! f" {# j8 B: ~
Voltage test between terminals 9.2 5 5 3 q- J# f0 z( o
Voltage test between terminals and container 10.2 5 5 36 N$ a' g5 `2 G3 h6 H [' p
Lightning impulse voltage test between terminals and
" m2 T8 d8 d/ m& U4 v- a+ pcontainer
O; N- o% i7 s15 5 5 3
: ?8 U! E# h. p X* G! {: U; aDischarge test 16 3 3 3* ]5 \1 I" h1 p" o
Ageing test 17 5 3 2
; G/ B* y6 Y9 E, C4 j( aSelf-healing test 18 5 3 3
: a% C3 y- f7 o- @Destruction test 19 5 3 2- @/ N0 ~; c! s
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发表于 2017-1-7 11:22
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