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|  DSH 405& ] o( v( x7 F$ H1 M3 w3 Z4 W
) s5 ?$ Y3 R9 U$ n8 @) Q8 Z4 I
| Leakage current in secondary circuits
- q9 W0 f$ j Z" p4 \4 ~8 y, G/ ^ | 17g)
; E$ F* T' B+ D3 r | 60601-1(ed.2);am1;am2( n1 ?+ O. m3 N9 f) p
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2 U2 l; h/ U' w4 Z6 Q% w3 XStandard(s)- (year and edition):3 C8 x4 }& Q/ K _+ ~
IEC 60601-1:1988 Ed.2 Am1+Am2
, J; V7 |( b" xSub clause(s): 17 g)
( U5 E8 u' d: Y, M4 U0 \* XSheet n°: DSH-405
3 b' `9 D8 f3 z1 `Subject: Leakage current in secondary circuits" h( H5 P, F3 W; }( B1 K
Key words: Leakage current, secondary circuit6 S) ^3 I) |7 z
Confirmed by CTL at its 39th meeting, in Cologne
5 J+ H. m* ?! }7 b8 p0 }Question:
: L0 g' ]( Q1 e) ]) y9 p; \If secondary circuit impedances limit the leakage current, is further investigation of secondary' `8 f: [8 r4 g* S
circuits required? (refer to sub-clause 52.5).- I, ~& m+ s9 b2 d1 h. X
Decision:
8 ?6 i' `* B% ~# _Secondary circuits providing protective means after short-circuiting of inadequate AIR
% F7 x) q' a7 ~9 T0 m. o. B) |5 PCLEARANCE and CREEPAGE DISTANCE must be investigated. Failure of components in; B- ~/ b( r$ [
these circuits shall be investigated as a SINGLE FAULT CONDITION. Failure of such
/ U8 N( e: V7 m5 ^& H; Icomponents shall be investigated as a SINGLE FAULT CONDITION.
+ g+ r: R% D0 X* ^
8 b1 q8 b1 q6 v2 e6 i1 z4 Z, B6 C, h: _% V
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发表于 2012-11-5 11:42
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