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| Capacitance; X( D4 e* m! g+ i+ a w
| 6.3.1.3
u: v% Y; t' `, i3 ]1 H U | 61010-1(ed.1);am1;am2
, f3 X2 ^% q: X! K% d |
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Standard:
) u: U' m9 F, E; F) k$ \IEC 61010-
! D) C' T# ]* P$ [1:1990+A1:1992+A2:1995' U0 N# G6 X9 @" M2 \9 ^
Sub clause:6 \9 h0 `8 T* u( [
6.3.1.3
( V+ h' T6 ~6 B. Z/ t3 hSheet n. 302" w# u% `% X l
Page 1(1)
2 x: g$ v3 r X0 t7 u% ?Subject:" E, m2 z7 e g& ]
Capacitance
, d4 Y8 S# p6 YKey words:% c h1 z+ a" K( A
- Capacitance
6 Z' Y/ j: p) r- Charge
1 }. N! G' Z) V; B0 D; s" ?7 n6 wDecision taken by2 O2 x$ \4 r: X! |7 X: I
ETF3 and confirmed9 F2 ?8 l' [% g8 Y" X' S
by CTL at its 38th
, C- d. B4 [8 e Z7 L n; T5 gmeeting, in Toronto
9 l5 W Z- S* G' Q# Y# zQuestion:- b+ Y5 y$ K0 C8 }) |2 g( u# W
How can the stored charge be measured, in particular where the circuit is complex?
) J& X- f4 {% u! o" w* JDecision and Explanation:
& x0 A& O$ D! SOnly the charge accessible to the user is of concern under the standard. Therefore, where the# L9 v( e; l8 U1 W! H2 q/ C: w4 G
circuit is complex, it is considered that a method of measurement from the accessible part is/ w9 W) O% o- x$ i5 `
needed. It is, therefore, recommended that a procedure of discharge through a defined
; P: a0 K2 _* U& F; M0 x- nresistor is used, monitoring the voltage – time profile to provide a method of calculation of Y. w! X! H6 ^" K, L
charge.
$ c! d2 O* N0 DWhen this method is used it is requested that details are recorded in the report for the benefit5 ]% }2 j' `# w6 G/ b7 i
of CB members.
5 y( m6 u) v- j uThe method described in IEC 60950 Subclause 2.1.10 is recommended.
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发表于 2012-9-19 15:03
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