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本帖最后由 chinatown 于 2017-1-7 11:25 编辑
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Question M9 y0 r- z1 i
How many samples shall be subjected to the individual type tests according to clause 6.2 of IEC1 v: \% ?- L, @7 m; g
60831-1 for shunt power capacitors?8 j) m `; x* ~2 D9 A D7 e9 S' }
Decision& }4 n) n" K" r, S- |! d, Z
For the performance of a type test on shunt power capacitors according to IEC 60831-1 the following; b0 J! R4 q4 j% M& ]+ b
type test schedule shall be applied:0 T: y- G+ z+ ]7 i9 V& i9 A' P
Type test schedule:& v( P# Q( W1 _/ ?2 x |
Tests Subclause Number of samples to be inspected
/ D; _; J+ W2 a9 aSingle-phase% E" L6 O9 R( g) S& L7 y" Q
units8 p3 y2 [( U1 S8 K0 n
Three-phase units
# G) z( X& j/ B1 D1 A/ i≤ 10 kvar > 10 kvar+ z! J% y& i3 H" y
Thermal stability test 13 1 1 1
" h0 r: V$ l- J2 F' Z0 {4 bMeasurement of the tangent of the loss angle (tan δ)
" S! x, ^# o3 U6 f9 wof the capacitor at elevated temperature( [6 w( O# u8 i" d9 L3 O
14 1 1 1/ p! H ?$ B& H w3 \$ t% P$ R* A
Voltage test between terminals 9.2 5 5 3
8 s, {7 Q1 u! J MVoltage test between terminals and container 10.2 5 5 3
* a g% a- A8 e2 RLightning impulse voltage test between terminals and
* I4 `4 V0 i- P X4 Ycontainer
h ^8 J* q [1 c" r15 5 5 32 [; ?1 o* h+ j7 c' }" A; _* w
Discharge test 16 3 3 3/ m) O, N2 @+ [" D9 O
Ageing test 17 5 3 2
- N6 |: y0 X5 ?) D. p6 ?9 S- LSelf-healing test 18 5 3 3# G+ B. r& N+ O+ f( L
Destruction test 19 5 3 2. N' i8 h, \0 |3 K1 M4 i
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发表于 2017-1-7 11:22
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