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各位大神,
. f4 |3 t, E8 A s/ I( @# k" d 大家是怎么理解UL1598这18.16段话的?(我用红色标识了)# s; L% \; h5 g. [ Q
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18.1 Dielectric voltage-withstand
0 H& k3 [) e3 b18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.8 Z4 \# }6 Z6 d, W9 L
18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied2 X% E* G( ~" @7 a& S
between live parts and accessible non-current-carrying metal parts, including parts accessible only during& e' u& L1 S4 \
relamping.1 R, _7 F4 W3 F) T4 ~
18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice
; ^0 P+ S4 z0 q; Ithe rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at+ m/ w, o7 V4 I8 U
1.414 times the AC potential denoted above.
& x+ @: O! @! V0 M V5 [% l18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required/ t2 `9 _ c( Y8 ?) s. }
test value is reached or breakdown occurs. During the test, any switches or other controls shall be in the
. Y' q( R& @1 C1 k1 r$ w/ dON position.
9 d, ]% K3 v% u& v1 {: N: x18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or
( e: f3 k. W2 |0 ` J+ Gdecorative parts not likely to become energized shall not be required to be in place.' |/ S* [) \/ n# n3 S& T+ m+ \
18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can1 x2 V! X7 q% h( j
be damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be0 e0 ~4 L" p. q
rearranged for the purpose of the test to reduce the likelihood of solid state component damage while
7 Z6 k6 B, R; n, I+ b- L/ v" Uretaining the representative dielectric stress on the circuit.
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