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各位大神,
* c3 x% h! R, ~2 _! N/ K( r 大家是怎么理解UL1598这18.16段话的?(我用红色标识了)
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6 V) P+ s( i# S$ b4 `) M8 G18.1 Dielectric voltage-withstand
% @" ^" Q. N! H2 k: @8 p6 S7 F18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.
! _& m9 ] u' G# }+ P$ u18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied! a G' L8 d6 h5 h6 k. Q
between live parts and accessible non-current-carrying metal parts, including parts accessible only during
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18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice
}3 b0 V* Y5 h4 sthe rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at
7 d! A* H+ ]# ]2 J) t6 I& f1.414 times the AC potential denoted above.2 {+ e( J& u" C5 @4 e# v+ X# ~
18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required
; S5 }/ M/ m/ i. Q) T/ p( ]test value is reached or breakdown occurs. During the test, any switches or other controls shall be in the+ J J1 s( k( {% D' J0 Y: Y
ON position.
}- Q5 `0 [% z# w3 K18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or, b& ~4 E1 w) R( T, V
decorative parts not likely to become energized shall not be required to be in place.
- c/ A+ x% @0 x2 _( n" o/ p1 ^) r5 O7 c18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can
$ x& a$ }" k3 v2 y7 N4 cbe damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be
; @3 O) }8 t* e* ]4 A0 Krearranged for the purpose of the test to reduce the likelihood of solid state component damage while2 E6 O! V2 K5 W, n0 N" b, ]
retaining the representative dielectric stress on the circuit.3 n9 b& F* i$ [4 p! Y1 Q' N
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