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| DSH 4054 d$ ^! c0 a# `7 {& m0 A( o7 x9 R
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| Leakage current in secondary circuits( T w$ v9 E9 U) Q9 j" u5 ]
| 17g)( B& q( B8 |$ u
| 60601-1(ed.2);am1;am2+ f& ]& |3 p: H2 _/ q6 n, M. E
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Standard(s)- (year and edition):$ Q& d% v' E1 C
IEC 60601-1:1988 Ed.2 Am1+Am23 d3 l4 P$ t' y' H' s% Q: l
Sub clause(s): 17 g)( Y7 }8 n! z; m& |* D
Sheet n°: DSH-405
. Z% b# e7 J% @$ ?8 ASubject: Leakage current in secondary circuits" G- \2 |( ]6 N2 Z( }5 V" h
Key words: Leakage current, secondary circuit7 d* [/ y$ _( [5 _% \$ ]
Confirmed by CTL at its 39th meeting, in Cologne- ?/ \; d, G% p
Question:. {9 _. ] O2 D" K2 v$ R
If secondary circuit impedances limit the leakage current, is further investigation of secondary
- }' B- u2 ?" J. Y1 Z+ [) Mcircuits required? (refer to sub-clause 52.5).
: `- K: q& M; R7 b2 Z% \1 QDecision:6 u" W- `% g- s9 @ Z
Secondary circuits providing protective means after short-circuiting of inadequate AIR" X9 z% p7 y8 }% S" |' W5 e
CLEARANCE and CREEPAGE DISTANCE must be investigated. Failure of components in
, M* h* T# T3 }these circuits shall be investigated as a SINGLE FAULT CONDITION. Failure of such
! L! K Q0 @, `1 E( ^; o# Q( z: `components shall be investigated as a SINGLE FAULT CONDITION.
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