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各位大神,
: o/ Z: Q! u) D! R! `) O 大家是怎么理解UL1598这18.16段话的?(我用红色标识了). z0 P6 x! S0 c3 H( V" l& |
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# O7 a% B m! H2 X- V# ^+ j18.1 Dielectric voltage-withstand
5 h, A; _1 ^+ V* `18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.
1 R- F, ~) H# }+ o' L; ^2 E" x18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied! u# [! b& Q' ~/ |
between live parts and accessible non-current-carrying metal parts, including parts accessible only during
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18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice
! _1 }. @+ I U# l: ~* {the rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at# y3 z, B6 ~( p; V7 S
1.414 times the AC potential denoted above. \1 m! f/ ]! I; H# x# Y1 l
18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required
5 A% @' U( Y$ s, b% c1 M2 D# h, mtest value is reached or breakdown occurs. During the test, any switches or other controls shall be in the" [: s1 d% F8 X/ ?
ON position.
4 Z+ l3 Y2 t; X6 s m8 ~/ ?' f18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or
. ^. A" e. b) w3 G( ~% jdecorative parts not likely to become energized shall not be required to be in place.
, h# {& [0 @3 m o, ^18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can
! j5 R' y6 P8 A& K5 Bbe damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be5 y; i" d7 x- S! b2 W/ P
rearranged for the purpose of the test to reduce the likelihood of solid state component damage while
7 a9 ^5 ^* r7 h; |; i& Q5 Wretaining the representative dielectric stress on the circuit.* H- Z# H4 [" W4 K. G& x S
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