|
各位大神,5 D2 w! F$ U, |+ ?9 b
大家是怎么理解UL1598这18.16段话的?(我用红色标识了)
* ?$ _8 z% r2 l# n8 e# f* x, t e: q! H% o+ Z ~$ N0 U; U; k% y
6 A: v0 l) A; ] S- b- a2 w3 a' B! c! G
18.1 Dielectric voltage-withstand
, T* m% U z8 Q/ Z8 f18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.
# R1 J, Z% I7 X( z% W18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied
* r" H5 b- K9 N& f, P1 ~between live parts and accessible non-current-carrying metal parts, including parts accessible only during3 X) g* _/ m' }# r9 z7 i
relamping.0 c; _( s2 T, O5 K6 K
18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice. b* {+ H% R1 ]6 j
the rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at3 G- l) s$ }( i
1.414 times the AC potential denoted above.3 i# _) p7 o \/ _3 b/ x1 _
18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required
! E7 P; ^* J# X; qtest value is reached or breakdown occurs. During the test, any switches or other controls shall be in the$ ]8 q) }2 Z( \- m* E" F7 o$ s
ON position.
+ i/ o; R1 ^" ]% \$ ~18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or
" @: F5 w: R- f# kdecorative parts not likely to become energized shall not be required to be in place. W' V5 i( ~- F% r
18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can) e3 j6 |3 P9 t& L
be damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be! Q4 D" y: ^( l/ l8 A
rearranged for the purpose of the test to reduce the likelihood of solid state component damage while
/ X5 S, W X! l* V3 Fretaining the representative dielectric stress on the circuit.& z4 r p: r" Y5 [7 p3 h5 V
6 @' u2 d' Z2 w7 E1 v( ]: h1 h
|
|