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|  DSH 405, t1 c9 }: t4 }+ q4 I
* S" G. t! g1 G* `$ V | Leakage current in secondary circuits3 _% C/ A$ ?1 V; h4 y" `9 H
| 17g)
! |3 V r9 h- r2 T& h! L' Q | 60601-1(ed.2);am1;am2/ N; G. p$ H% l+ d5 m
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- R( O- b- C! AStandard(s)- (year and edition):: n4 @# o5 c6 I" r6 s1 U& q
IEC 60601-1:1988 Ed.2 Am1+Am2
- S% R2 X* Y. H2 g/ o8 @& Y) n& qSub clause(s): 17 g)
. G4 l g8 @( H2 O: B) ?Sheet n°: DSH-405
, k; k- i% W3 T0 USubject: Leakage current in secondary circuits' g X4 u5 \" C1 e( w
Key words: Leakage current, secondary circuit: y% }1 L( @& t3 @4 L4 L% r
Confirmed by CTL at its 39th meeting, in Cologne7 |5 v) h- U9 W8 e' c
Question:
% G2 ^8 r& o- oIf secondary circuit impedances limit the leakage current, is further investigation of secondary9 J+ d+ Q2 C7 N) ]! W
circuits required? (refer to sub-clause 52.5).& L p8 i8 K3 T7 ]( p
Decision:
! R4 F- E* \6 r6 U$ `Secondary circuits providing protective means after short-circuiting of inadequate AIR1 d* C8 ~9 I* @4 [9 y; r- z H
CLEARANCE and CREEPAGE DISTANCE must be investigated. Failure of components in- ^ D" _; z1 U/ M; @1 B. ~+ \; \
these circuits shall be investigated as a SINGLE FAULT CONDITION. Failure of such* ?' @# j2 M* n8 a2 p) P
components shall be investigated as a SINGLE FAULT CONDITION.5 a- o9 Q2 F% r, ?" g! v
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发表于 2012-11-5 11:42
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