|
|
& V r% _# L1 q9 n! J+ D5 D: ~) X% ]6 V* |
| Capacitance/ Q8 ?+ P j% M, Z- \
| 6.3.1.3' \: c2 d" {7 n1 f9 {
| 61010-1(ed.1);am1;am2
% C3 g `/ p$ j6 w |
9 I0 F/ Y4 h0 B7 H. ~- @2 \( W
H! d6 q- S# n C: zStandard:
1 ^5 f/ m" Y1 H/ C* ^& mIEC 61010-; p; D+ _8 o0 b1 ^$ x$ o
1:1990+A1:1992+A2:1995
! }2 H2 o5 v1 |% i+ T6 }, p" G* |Sub clause:2 J, H. a9 F9 j0 ^! ~. n: s
6.3.1.3
& K3 b' X' h% ^* \Sheet n. 302, A! Z! p9 V2 f8 Q2 E" x6 G7 Y5 W
Page 1(1)
: Z$ Q. R% R* A: ]8 I6 hSubject:- A9 ?2 H' Y9 z
Capacitance
7 `$ N/ d5 R: a4 W5 v/ r: BKey words:& t2 ^+ g, ?) Q9 [9 B6 \
- Capacitance
: A0 h0 u/ ?" M) m3 }1 O- Charge
- l2 e6 n d) U5 E i, R4 \9 EDecision taken by& ?; |7 D6 x! X4 f& H9 K
ETF3 and confirmed
; l7 |4 m6 ^: w! L% q+ {' Zby CTL at its 38th- E( w: v- A3 {3 }
meeting, in Toronto
' K) R4 \0 K V- @Question:
* J. D% C9 J; @7 U8 w" W$ @( @; v& uHow can the stored charge be measured, in particular where the circuit is complex?
$ m7 S; d4 s+ y0 B* |5 dDecision and Explanation:
; ^7 q# ^# J- x% T+ mOnly the charge accessible to the user is of concern under the standard. Therefore, where the
k$ E5 ]/ q, F3 r! f" ~$ ocircuit is complex, it is considered that a method of measurement from the accessible part is
5 Q( ]8 s; l1 |& ineeded. It is, therefore, recommended that a procedure of discharge through a defined7 R& r! B9 m) n" b7 h; N! O/ O
resistor is used, monitoring the voltage – time profile to provide a method of calculation of
3 v Q$ g. H$ wcharge.4 d( k) G& l! l; R
When this method is used it is requested that details are recorded in the report for the benefit
, w2 c& W( e( e& s) H: ^) L6 kof CB members.# b# G) S- @: ~0 j: A
The method described in IEC 60950 Subclause 2.1.10 is recommended.
5 x8 I5 N1 j( k; p" }$ i/ m7 F, h/ t% W* |( u2 Q9 p
- d7 j2 i# S) G+ X5 y1 l
2 S3 J2 c- ~5 _2 M8 m
|
本帖子中包含更多资源
您需要 登录 才可以下载或查看，没有帐号？注册安规
x
|
/2 
|关于安规|小黑屋|安规QQ群|Archiver|手机版|安规网
( 粤ICP13023453-10 ) 
窥视卡
雷达卡
发表于 2012-9-19 15:03
收藏
分享
好帖
鸡蛋
提升卡
置顶卡
沉默卡
喧嚣卡
变色卡
抢沙发
千斤顶
显身卡