CE标准/EN 55014升级了吗？

2iso

广东安规检测
有限公司提供：

小型摆管淋雨试验机

IPX5X6X7喷水试验机

1000L恒温恒湿箱

各种试验指现货

可程式恒温恒湿试验箱

水平垂直燃烧机

自动卷线器试验机

耐划痕试验机

各种灯头量规现货

灼热丝试验机现货

GB1002插头量规

IPX1-X7淋雨现货

IEC61347/UL935镇流器热试验箱

灯具防风罩

IK冲击试验机

UL498插头插座量规

VDE0620插头插座量规

稳定性试验台

家电温升测试角

针焰试验机现货

热电偶焊机现货

家电125mm试验指

E12灯头量规

无绳壶无绳电熨斗插拔寿命试验机

IEC60335试验指甲

引用第9楼Naomi于2008-12-21 15:56发表的  :
$ ]! e% B+ ~8 K: n+ C. x4 v請參考附件
0 R5 u8 M6 k" v
' E% j0 ~, [- d5 W/ Q& L& Y$ b" [其中,
DOP : 表示發行日期
通常DoP 之後就可以開始使用
  @2 J6 `9 p/ w* j5 B: b; S.......

2 e  G* x* c' R2 V* f# X可以贴上链结网址吗? 谢谢.

william_hp

有没有附件传上来

daisy_1208

引用第10楼2iso于2009-03-11 08:21发表的  :



4 U& \' o+ O; J# d$ t6 l" \6 c可以贴上链结网址吗? 谢谢.

1 N& T5 \/ k7 s; G) }. r
2 ?  Y! w, Y- n) X* Z- w) _5 Vhttp://tcelis.cenelec.be/pls/por ... ;p_arg_values=21247

louislin

由于我的标准上有公司名字，就不直接贴上了，差异部分如下
# F& [& U3 b" z( e# i; n
Page 9
1 Scope and object
Replace the title of this clause by “Scope”
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
2 N/ [) J5 a  v3 s- i7 B$ NPage 11
7 x2 x8 i  V1 n; J: E: d$ `" M2 Normative references
1 |2 X2 C: h/ f! x0 j8 \5 }7 c( M5 DReplace the text by the following:
The following referenced documents are indispensable for the application of this document.
; m6 c6 F% y, C/ F. PFor dated references, only the edition cited applies. For undated references, the latest edition
& f4 l+ t6 e/ G( iof the referenced document (including any amendments) applies.
3 p) M+ |7 q0 z/ tIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
/ @* k! x0 _6 Q- ^6 YElectromagnetic compatibility
/ [& e: A- T3 ]1 @4 c

CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
6 E  c7 D* ]6 U# kmeasurement techniques – Electrostatic discharge immunity test
Amendment 1:1998
% S2 }' |* E# i; `( l# O8 X: PAmendment 2:20001
$ K/ w; k1 m, Y, p) u4 LIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
& ~1 _3 d. o7 U# Z3 g+ p& TAmendment 1:20072
; @( y1 a; t9 S, `2 ?; A( iIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
measurement techniques – Electrical fast transient/burst immunity test
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
measurement techniques – Surge immunity test
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
fields
Amendment 1:2004
Amendment 2:20063
) t1 u; l& k0 ]IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
( {: I5 J  w( y5 r1 R% m2 eCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
electric tools and similar apparatus – Part 1: Emission
Page 13
: V# X! n/ k- A1 n3 Definitions
Replace the title of this clause by “Terms and definitions”.
Replace the first paragraph by the following:
6 k9 z( e2 s3 s2 g  D' z( ^* qFor the purposes of this document, the terms and definitions related to EMC and related
" ^! W8 x" p8 @6 i$ a. @phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
Add the following new definition:
. W9 g; E  z. \" c( T3.18
clock frequency
( M+ Z! [, |4 i% V- [8 W2 Ffundamental frequency of any signal used in the device, excluding those which are solely
used inside integrated circuits (IC)
9 @4 O6 K) O% N+ W) ]0 `0 ^NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
. l' h6 p. ~7 M7 Pfrom lower clock oscillator frequencies outside the IC.
$ _* n4 W1 w9 c" Y  n! x- f  D2 b, E___________
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
7 a! c+ \7 u! J2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
) v1 E; o! F6 L3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.

! S8 R4 b) P& D0 t$ M
1 P! M% G& ~/ P$ w5 V– 4 – CISPR 14-2 Amend. 2 © IEC:2008
+ y' C! }% H* i' @Page 13
4 Classification of apparatus
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
Page 15
" t2 [+ k1 `) s7 B+ _5 Tests
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
Page 21
" ?( L) f; _3 l# A# g; ?7 l5.6 Surges
. T+ S1 g, U) i) q/ E* ~6 U+ P) G; qTable 12 – Input a.c. power ports
5 j) n, H) c/ ]  @7 o+ KIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
"Line-to-Line with 2 Ω Impedance".
' Q! w* N! K8 E  |3 VAfter Table 12, add the following paragraph as a new second paragraph:
4 u# }. S8 y  ~3 ]The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
1 _  y: t9 I/ ]7 d% e" e* O" V4 othe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
4 W9 L+ X! `0 }given in Table 12 are not required.
5.7 Voltage dips and interruptions
Table 13 – Input a.c. power ports
Replace the existing Table 13 by the following new Table 13:
# Z9 A, T) ]# s8 _( _5 BTable 13 – Input a.c. power ports
* e7 K6 h# ~, k# V9 {' @  y  ?Durations for voltage dips
( v0 F$ Q7 m+ _/ ~  E1 P: i) m0 \# {7 @Environmental Test set-up
phenomena
Test level
in % UT
50 Hz 60 Hz
, h) P! C5 f/ EVoltage dips
0 i' g& l6 w2 ain % UT
5 Q) x' O$ G$ o( A100
60
30
0
40
70
) o5 p- w4 |4 M) P; x: Y4 ~0,5 cycle
; A! e- W* ]& l, R1 Z* Q% H10 cycles
. h7 |2 w1 ~  H- ^25 cycles
0,5 cycle
12 cycles
30 cycles
IEC 61000-4-11
' f/ s9 Q8 S8 d! H5 G; QVoltage change shall
, x) n$ n; H9 B: f$ b  l3 G" Doccur at zero crossing
7 C7 b' T0 ^) R- xUT is the rated voltage of the equipment under test.

1 c( o: u# n1 a! ^- u. f
1 a- ~4 r9 W3 n9 pCISPR 14-2 Amend. 2 © IEC:2008 – 5 –
Page 27
8 Conditions during testing
5 B% F# R! o' L9 Z8.1 Replace the first paragraph by the following paragraph:
. O6 e6 y6 p5 i9 Q- mUnless otherwise specified, the tests shall be made while the apparatus is operated as
intended by the manufacturer, in the most susceptible operating mode consistent with normal
  k* u! C/ w+ b' K- quse.
/ b5 r4 h0 W4 A% t) B+ _  D8.4 Delete the second sentence.
8.7 Delete this subclause.
8.8 Renumber this subclause as 8.7
Page 29
9 Assessment of conformity
9.2 Statistical evaluation
0 C5 R+ O  `2 j( X. KReplace the existing Note by the following:
1 ^$ Y0 V$ J9 [7 ZNOTE For general information on the statistical consideration in the determination EMC compliance, see
2 V1 h( H8 w4 U- W6 _9 jCISPR/TR 16-4-3.
Page 31
5 F3 n4 |2 f, [1 Q: g0 l7 l4 b# ]5 Y10 Product documentation
Delete this clause.
! K  y# l! p9 i# g" uBibliography
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
4 T. H+ ~6 c2 `1 V( q* y, }5 JCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
the determination of EMC compliance of mass-produced products (only available in English)

honglipardon

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