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DSH 535/ A4 Y3 R1 C) M# l! S- F& b3 G
| Reduction of clearance and creepage distance
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& S |/ @) @/ L% R/ f | 60601-1(ed.2);am1;am25 y% G6 r3 c$ M( D/ J8 U
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Standard(s)- (year and edition):
) L) q% r2 F2 L" X! X) N& @' H( KIEC 60601-1:1988+A1 +A2
% ?3 s# O# j, z+ i. I: ~9 CSub clause(s):
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Sheet n°: 535
4 D! |3 O# Q9 q1 }7 b. c# ]' ESubject:2 U- |) @1 a6 a- X- o
Reduction of clearance and
/ P6 X% h1 w) d" _9 b/ Bcreepage distances
0 X: }# { M' l! x Y: I. yKey words:
7 ~, q3 Y% J9 |# H# q7 _ AClearance, creepage, reduction,/ f( S' z0 U+ i) q
tracking resistance: M! k2 r' j! y& y; v( t0 P
Decision taken at the 40th
6 u i" Z/ T( r6 ~7 Dmeeting 2003
+ ?( s4 @9 p* X: |Question:
- Y8 |+ W7 t0 ?6 j* n6 [Is it permitted to reduce the creepage and clearance requirements of clause 57.10 based on evidence that4 m( n# p7 ~) G6 ~
the material being assessed has a high resistivity to tracking?
5 G5 u8 k4 x; z7 ?( J4 D& GIf it is permitted, what IEC Publication should be used as a guideline in determining the permitted s% Z! ^3 j/ p" M3 W
reduced creepage and clearance distances?
3 i' Q5 g3 N& i9 X8 dDecision:
3 T' G; T- k# ^& ~This edition of the standard does not allow reduction in clearance and creepage distance.; D# ? R8 E+ z) w* [: j, r
Explanatory notes:3 m8 C* {5 n+ t/ ]9 j; W+ W; A9 j& K
This problem will be transferred to SC62A/WG14 to make a recommendation to the 2nd edition do deal
) o& O) h! B1 R C2 w- P9 \+ X; ewith this issue. The 3rd edition will address this issue.
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