|
|
|  DSH 253A, ?- N* r3 o3 u7 `0 U1 n, A
4 \% I% d$ ~, O4 M5 ~0 S) i, G) r5 t+ H | Resistance to tracking4 K6 l4 J$ e" ` F! \
| 30.3
. a' E3 l. A, e) q | 60335-1(ed.2)
, _. I: V/ K' B/ x0 S% O |
; _; l1 o' v+ M8 I! U p
Standard: IEC 335-1, Ed.2 9 m1 b3 f/ | q7 O) Q. R; d# P
Sub clause: 30.3
7 i; g% _& N. m. K+ p6 ?Sheet n. 253 A
4 V( d; Z/ I2 |/ Y$ M; y9 A" SSubject: Resistance to tracking 5 N. |2 C/ c7 C7 _0 }! r7 T ?
Key words:2 n# ~% e) K$ e9 T+ Y
- tracking
$ y; o- D' g7 `, k: Z( M, W9 v" yDecision 16 of 34th meeting/1997
; |7 l, b( a$ f* j( p; N* iQuestion:
$ U; E; J% |- G! |8 k- PWhat is the minimum potential below which a tracking path is not any more liable to q, A) o% t9 Z/ f
occur and therefore the test is not necessary ?
4 j! c& a5 R! D# m `Decision:
9 x; I6 E& r. o$ h4 `Based on subclauses 2.9.4, note 1, and 8.1.4, no tracking test is needed for SELV5 c8 A: Y& `3 U9 t3 w' n
and PELV circuits.
( k" ]2 m! X* _) n
3 o' l: ~' Z# O1 `$ |
( Z d0 ]( N; y& |& g1 l( J: V |
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