|
给你一点资料参考一下.
1 N0 E, w! p6 Z& X2 r2 NClause: 2.2.2 Voltage under Normal Conditions Test
/ J: G. }* \1 f# R+ k% X; t. RApplicable apparatus: Applicable with SELV circuit
7 [$ O! Z4 n7 o7 x% c0 j' p% TOperation:
3 t9 r/ Y+ j2 n) i- u% B9 a1. EUT: (1) AC mains: U=1.06 / 1.1 Un, F=Fn; (2) DC mains: U=1.2 Un (if the tolerance is declared by client, to conduct by the client’s maximum declared value). Both under any load conditions which can generate maximum output voltage.
$ Z; W% ?. ?7 ]- M" B- Q0 B0 h2.Each single SELV circuit or interconnected SELV circuits are measured& O/ V$ W/ @" K' {* j
Criteria:The measured voltage shall not exceed 42.4 V peak or 60 V d.c.! n( |5 s$ b, l" S" P
% S8 t' w6 I) w$ D' |% Q# `& g) m( D+ ]" _
Clause: 2.2.3 Voltage under fault Conditions Test1 Y; T& c F& ^. Z1 c5 r' o
Applicable apparatus: Applicable with SELV circuit8 Y7 K1 F m, R2 j* P: c8 ~
Operation:
% ^1 N) v2 d; C0 D1 q1.EUT: (1) AC mains: U=1.06 / 1.1 Un, F=Fn; (2) DC mains: U=1.2 Un (if the tolerance is declared by client, to conduct by the client’s maximum declared value). Both under any load conditions which can generate maximum output voltage.+ V1 {' e- m$ O! e2 q4 ~" a( W
2.Each single SELV circuit or interconnected SELV circuits are measured.
9 Y" _" X' Q0 L/ I; f9 n3.A single failure of basic insulation or supplementary insulation or of a component failure is simulated one at a time.! r- M! ~4 P2 B) A
4.Voltages at the SELV circuits are measured by storage oscilloscope.
; X+ ?- X+ ~( J0 v V, T5.For voltage having repetitive nature after a fault, the highest voltage, duration exceed (t1) and not exceed (t2) 42.4 V peak or 60 V d.c. shall be recorded.
: h" S, t+ a( h g% L2 SCriteria:
9 C$ [+ y3 J ]4 A8 U1.The measured max. voltage shall not exceed 71 V peak or 120 V d.c., and/ D6 t! D- b2 c0 V+ ~ l
2.The duration where exceed 42.4 V peak or 60 V d.c shall less than 0.2 s, and 8 X0 V8 g {6 j" h2 _" v
3.if t1<= 20 ms, t2 shall > 1 s, if t1 > 20 ms, t2 shall > 3 s |
|