CE标准/EN 55014升级了吗？

ALICE

广东安规检测
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各位
上周拿一个样机给认证机构做EMC测试，出草稿报告,审核时发现标准中的一条写：EN55014-2：1997+A1：2001+A2：2008.
请问，CE的EN55014版本升级了吗？什么时候开始实施？增加的A2主要测试那方面的，是否所有EMC测试都有这要求？请大家告知。谢谢！

honglipardon

学习到了~

louislin

由于我的标准上有公司名字，就不直接贴上了，差异部分如下
$ }" U/ M- Y5 l" G. Z  M3 g) X" i1 ?) r
- h9 N! v% n8 r) I! `Page 9
1 Scope and object
Replace the title of this clause by “Scope”
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
4 A+ i% Q2 B- h" M- f& `. e: d+ d5 RPage 11
2 Normative references
Replace the text by the following:
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
Electromagnetic compatibility


CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
measurement techniques – Electrostatic discharge immunity test
2 s# x% B* k% y2 h; NAmendment 1:1998
Amendment 2:20001
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
% ]9 I4 j1 P5 N# G. S. S- L* y5 lmeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
Amendment 1:20072
+ u' J. m2 `9 h- f9 z/ G6 L8 X8 L3 kIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
measurement techniques – Electrical fast transient/burst immunity test
( d9 R  _1 l3 b: Y' v9 Z+ UIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
measurement techniques – Surge immunity test
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
* {5 e* w% Y4 s; l, t  Dfields
6 }& d: x, \9 U3 O0 H9 ]" M8 ]# o4 w, KAmendment 1:2004
) B+ J7 o# g+ i' g8 ?, t5 uAmendment 2:20063
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
- n1 V6 i) X  Z2 `, Kmeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
5 f2 D) K# H; [/ ZCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
) L5 L. f5 {$ A5 H% y- n. E6 nelectric tools and similar apparatus – Part 1: Emission
& k& z; o* M3 x$ {4 Z4 e$ o2 @Page 13
3 Definitions
1 i; B/ n" S' z. x. x, j) q! ^0 mReplace the title of this clause by “Terms and definitions”.
Replace the first paragraph by the following:
# {. K+ ~% V! O6 t  MFor the purposes of this document, the terms and definitions related to EMC and related
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
- `% s) T+ n: B/ M0 ~4 ^; S" |Add the following new definition:
- A& E" F* J- j3.18
clock frequency
. {( `6 z# V1 i( `fundamental frequency of any signal used in the device, excluding those which are solely
" H2 P% ]: c: k( ]5 Jused inside integrated circuits (IC)
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
4 m6 \3 N8 \: k, p) P% L! [, o+ ?' Z7 pfrom lower clock oscillator frequencies outside the IC.
: k9 I2 ^# [2 u. u( K. i9 N, M. J___________
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
+ F0 V# ?! q7 A0 H. Z( G- M6 Y2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.


2 h/ u7 V! m, @3 v2 W9 b– 4 – CISPR 14-2 Amend. 2 © IEC:2008
Page 13
4 |5 p) t. f$ V$ z$ F2 w7 V4 Classification of apparatus
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
) a8 N7 c- {+ Q# ^Page 15
% e" O2 X: k3 Z  ^: o' T( K* \5 Tests
& {0 B; x) V6 zThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
  M" O4 X* Y  L7 E: r/ zPage 21
5.6 Surges
Table 12 – Input a.c. power ports
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
& K2 ?0 W+ j5 u9 A8 L; d"Line-to-Line with 2 Ω Impedance".
After Table 12, add the following paragraph as a new second paragraph:
, t/ m7 {' [' W% E: |The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
. ?1 I6 G) K/ c; ythe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
; T' ?4 h1 ?& `/ c7 M) Pgiven in Table 12 are not required.
0 [! j* Y4 b  C6 f+ d+ u5.7 Voltage dips and interruptions
Table 13 – Input a.c. power ports
Replace the existing Table 13 by the following new Table 13:
Table 13 – Input a.c. power ports
8 ?& C" J& Q: k3 A$ x3 KDurations for voltage dips
# }% M- B& N# Y( i* mEnvironmental Test set-up
+ q! l& ^6 R+ d1 sphenomena
Test level
in % UT
50 Hz 60 Hz
. F: g0 ]9 O; I% Z+ NVoltage dips
. l: @7 T+ h: _1 R+ A3 pin % UT
; f- n0 a  Z: F' O; X100
60
30
0
40
70
0,5 cycle
% |7 Z/ R* v* Q% b- s4 }10 cycles
25 cycles
3 K4 Q# n. ]3 j& d) i0,5 cycle
1 ?: q' p) a! ^! Z0 l12 cycles
; l) P, w# O2 c* S5 ?30 cycles
7 Z# [, \- r1 c5 t* W; {IEC 61000-4-11
Voltage change shall
4 h! d, |( H4 F2 l; @. e$ r- Poccur at zero crossing
UT is the rated voltage of the equipment under test.

! f0 @" W& }. A: _) `0 e, \( i
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
$ R4 s) t  u) DPage 27
' O" y. d' o1 t" E, C$ H8 Conditions during testing
' q1 w) D7 W' ~+ k8.1 Replace the first paragraph by the following paragraph:
" [: p( o0 Z- V, OUnless otherwise specified, the tests shall be made while the apparatus is operated as
intended by the manufacturer, in the most susceptible operating mode consistent with normal
use.
+ v- y& ~/ a# M. v" P: ?8.4 Delete the second sentence.
8.7 Delete this subclause.
% g  R2 N3 M" x- \: z* k8.8 Renumber this subclause as 8.7
2 g; n% d, Y; v& T  [1 P) ]$ FPage 29
9 Assessment of conformity
9.2 Statistical evaluation
Replace the existing Note by the following:
NOTE For general information on the statistical consideration in the determination EMC compliance, see
' w. Z3 t2 G! k3 T9 bCISPR/TR 16-4-3.
Page 31
10 Product documentation
4 b4 l/ H0 V* I  D4 CDelete this clause.
' [  v5 ~0 a+ vBibliography
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
the determination of EMC compliance of mass-produced products (only available in English)

daisy_1208

引用第10楼2iso于2009-03-11 08:21发表的  :



可以贴上链结网址吗? 谢谢.

+ X5 ]) k) y9 Q# v: ^) F  p# }6 |
4 Y' v2 c: @0 V' |http://tcelis.cenelec.be/pls/por ... ;p_arg_values=21247

william_hp

有没有附件传上来

2iso

引用第9楼Naomi于2008-12-21 15:56发表的  :
. `6 u3 F, j( U請參考附件
5 O: `0 H. P& Y3 S; l$ P* U
' f  y5 E. b5 K( e其中,
DOP : 表示發行日期
通常DoP 之後就可以開始使用
.......

. l- D1 ]+ v  @3 M6 t. ?
可以贴上链结网址吗? 谢谢.

Naomi

請參考附件

其中,
* ^+ b4 A0 E) @DOP : 表示發行日期
通常DoP 之後就可以開始使用
% b) k1 E, e3 x7 R0 I0 r1 X7 J
DOW :  表示強制日期
在此日期後, 必須使用此版本法規
0 }6 w+ o: B" k: b

6 H( L5 e5 i! `$ j( V* i& T7 `1 S2008/12/1 雖然已經確定此版本了
但是尚未發行,  一般也不能使用該版本法規

kxlaser

预计实施的真正时间要等明年的OJ公布，
认证机构的做法是合理的但是没有必要去做，新旧标准有一定时间的过渡期的，过渡期内新旧标准同时合法

ALICE

测试机构通知A2：2008是2009.6.1开始实施，希望楼主有相关标准资料，发出参考。EMC经常要用到