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1. 2.1.1.1 Access to energized parts+ y* D, M. s2 G* }5 }/ E D$ f- i
− bare parts of TNV CIRCUITS, except that access is permitted to:" ~ O( ?, G6 ]
• contacts of connectors that cannot be touched by the test probe (Figure 2C);
3 ^+ [( Q, w2 U' X* \d) A test with the test probe, Figure 2C, where appropriate. 标准里面这句话以下有说明。
$ I5 m% B6 Y3 T& q7 f- d9 l% Y/ }# W# e/ O! R
2. 6.2.1 Separation requirements2 L% r- g0 G: N8 P! P
b) Parts and circuitry that can be touched by the test finger, Figure 2A (see 2.1.1.1), except2 }3 x( L) w- M% }/ @2 x! f+ q
contacts of connectors that cannot be touched by the test probe, Figure 2C (see 2.1.1.1).其实就是上面的。 |
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