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UL 4703
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40 Arcing Test
# k% |6 p5 y% ~3 [% w40.1 General
8 _7 R; U& M h& w; p40.1.1 If the point of current (at rated operating voltage) and voltage (VL as determined from the
# M; t/ d" T+ {# i+ F& i; drelationship given in 39.2.2) that can appear across a cell or interconnect fracture is in the ²ARC TEST²
, M; B c$ v+ k+ ?# m' X6 ~zone in Figure 40.1, the module or panel shall comply with the provisions of 40.1.2 – 40.6.3. See also! v6 d8 X- X8 I
47.9.
8 @/ W" q% E2 j% n40.1.2 With reference to 40.1.1, during conditions of simulated cell or interconnect fracture, there shall be% ^6 c, C1 s- u# k
no ignition of the module or panel.( l8 t" ?% R/ ?' b$ d# G
40.2 Method A U# b( [! @1 g9 Q3 s
40.2.1 Similar modules or panels to be tested are to be connected in series to achieve an open-circuit
7 T, S! X3 |; `. s. Z5 @" h1 }voltage across the fracture equal to that which is present during normal use of the modules or panels with
' N+ w; ~5 U3 I- S- ethe specified bypass diodes. The modules and panels are to be irradiated at 80 mW/cm2 or more at 20 –
# [/ ~+ y7 c7 x. W$ e! X2 O" _7 e! f4 q30°C (68 – 86°F)." v) M: U1 M& e7 _
40.3 Method B$ v3 { N k' {& J! O+ p9 M6 m
40.3.1 A single module or panel is to be used with a separate power supply as described in 40.5.2; Z3 r5 d+ Q* j3 c
connected in series to provide the remainder of the source. The module or panel under test is to be
" ]/ u8 [" F) J% h' P, Nirradiated at 80 mW/cm2 or more at 20°C – 30°C (68°F – 86°F).: H* C, U; a0 C( P3 v& H
40.4 Methods A and B
& O4 s% U. F* I t' K40.4.1 All bypass diodes, either included with the module or panel or described in the markings shall be( \2 C" {+ n: c- x7 g& s: y+ X
included in the test circuit.) u+ `, e( d6 V9 i; a2 j
40.5 Method C
& o: C/ v: U* i4 Z4 D% a40.5.1 A single module or panel is to be used to provide the material for the ignition attempt. However,' g# D, x/ _ N: V
all power in the arc is to be provided by an external power supply as described in 40.5.2 connected in4 m. j. ?$ [4 s
series with only passive portions of the module’s circuit. Cells are to be jumpered if necessary to involve
2 B! @0 H2 ]2 vspecific portions of the module or panel insulation system.
* G& C. L- X1 H( N+ A* O: g40.5.2 With reference to 40.3.1 and 40.5.1 the power supply is to be a constant voltage supply with a8 C# v V, ?8 |! x- w: x( S+ N$ `
series connected current-limiting resistor. The parameters of the total system are to be as follows:
" G. h ?( G v9 ~a) Open-Circuit Voltage – The voltage that is across the fracture during normal use of the. l5 P7 i% q+ z* o- t
modules or panels with the specified bypass diodes./ J" E- n& Q8 |- b# q# Y
b) Short-Circuit Current – Not less than 80 percent nor more than the rated module or panel- J6 G3 z+ d5 w6 B) `" _: p
short-circuit current, when the current-limiting resistor is adjusted so that the voltage across the
9 f( y v# a8 y5 ?module or panel being tested is zero.
$ [$ _" E! O/ t7 r# y! C- I# b( w* O40.6 All methods. V( i4 @5 i2 k: I
40.6.1 The system load is to be a short circuit.
- ]0 T/ R3 p* s# G, L9 w40.6.2 Any connection(s) within the module or panel may be broken (fractured). The breaks are to be
* A0 h' ?6 G' T& _' i6 hchosen to achieve a worst case condition of maximum open-circuit voltage and/or maximum short-circuit
0 i0 y8 Y! h. e: T* Ocurrent at one of the chosen break points.
/ m: v; H5 l9 ]: `, AException: Any electrical connection made with wire of circular cross section or flexible braided
7 T6 J/ R9 h6 W% |; A& vconstruction that is mechanically secured to its connection points is not to be broken. Braided or stranded
! }3 r( W( D5 t, T: Owire shall not have any process performed on it that reduces its flexibility. Solder coating of a portion of
! Y8 ~6 X, W( A5 y- O% Rthe wire at the connection points is acceptable.
* K& `' l( E# y4 }* l40.6.3 An arc is to be drawn across the breaks, with the arc across the material of the module or panel3 ~1 E! q7 _( \2 S' t* o
that it might contact during use of the module or panel. The arcing is to be continued for 15 min at each
4 ]5 e! s2 h, B0 H* q1 N, Alocation tested. |
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