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Question
8 w9 u9 m! A* R1 |In which way shall the temperature rise test be carried out on a device composed of two or more
5 t. {' | y* tswitches, having the same or different pattern number mounted on a common body?
+ P& j4 X& f, |7 V( oThe construction is allowed in note 1 of sub-clause 7.1.1, but the testing conditions are interpretable
9 D1 s4 ^6 H' B* f5 min different ways in clause 17.1.
( }/ k5 y9 _: r) vDecision
& P3 b# j$ B4 L9 x" ^5 m0 Y% h6 lThe temperature rise test shall be performed separately on each individual switch on condition that it: B& \+ n0 b2 E5 h; c8 V) s
is a single-phase switch.
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