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Question
! t8 `/ {+ B0 x4 t! L" T0 [In which way shall the temperature rise test be carried out on a device composed of two or more
8 }0 l* N$ k# o9 w7 z. i9 ]switches, having the same or different pattern number mounted on a common body?
. b1 v; G5 v5 F9 gThe construction is allowed in note 1 of sub-clause 7.1.1, but the testing conditions are interpretable
7 H& V9 X$ g, u4 l5 uin different ways in clause 17.1.
9 `4 W. ?- i- R! I3 R+ N9 H: xDecision
' p5 i* W# u# A7 D; v! X* CThe temperature rise test shall be performed separately on each individual switch on condition that it* ~; q" V* }1 v5 E# t
is a single-phase switch.
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1 ?& {1 Y4 a$ }! q, i/ p$ k+ _1 C+ n5 g9 x
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