|
|
本帖最后由 chinatown 于 2017-1-7 11:25 编辑 / G. Y q% M5 Q! G) M0 B
8 X) q' R: U8 L9 ZQuestion
* m( n( } ^3 ~How many samples shall be subjected to the individual type tests according to clause 6.2 of IEC2 m* y# `$ n9 Z+ J
60831-1 for shunt power capacitors?
- d9 I4 e K" n( F* SDecision) T% n! J4 I* d
For the performance of a type test on shunt power capacitors according to IEC 60831-1 the following( w- _1 b- w/ o; z) ]+ u- p
type test schedule shall be applied:
. Z2 S1 c5 K. E6 q" CType test schedule:
3 M6 ^7 Y M, }0 y* @. |; yTests Subclause Number of samples to be inspected. l3 \, r4 _* F |6 |0 D
Single-phase0 b% y; U6 c7 O k- f1 i
units! o, p, N9 N! m: X) U
Three-phase units! _4 u& ~, u0 A; y6 s
≤ 10 kvar > 10 kvar
. \- q! X7 a- J t/ zThermal stability test 13 1 1 1
( E- P, g. X+ J# K7 TMeasurement of the tangent of the loss angle (tan δ)
0 h5 z2 o- O. \/ q% z5 Bof the capacitor at elevated temperature
. r# j1 p' I W* B6 @14 1 1 1
7 C0 O+ [+ E( b( n, f+ CVoltage test between terminals 9.2 5 5 36 _) l; {4 G2 t, C, L5 l% _0 S' T
Voltage test between terminals and container 10.2 5 5 3
U: [6 s8 J; p, H* N6 ], j R' KLightning impulse voltage test between terminals and2 I5 f0 w7 q: m- A) Q
container
3 E M! S$ ]$ z3 z$ E15 5 5 3
( K) }% [+ }; G+ ?Discharge test 16 3 3 3
8 d' e2 u5 i. C+ z: ]Ageing test 17 5 3 2& G8 U" b1 m6 H: i
Self-healing test 18 5 3 3
. t' p4 \. `/ O% f, {Destruction test 19 5 3 2
3 v& O" n& N5 U! V7 D! T$ x |
|
/1 
|关于安规|小黑屋|安规QQ群|Archiver|手机版|安规网
( 粤ICP13023453-10 ) 
窥视卡
雷达卡
发表于 2017-1-7 11:22
提升卡
置顶卡
沉默卡
喧嚣卡
变色卡
抢沙发
千斤顶
显身卡