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| DSH 3952 T A& c. J% B; J; s; A
- F4 Z: P" n4 O5 b# y | Separation of TNV-3 and SELV circuitry' O3 c6 j, r/ Q6 W4 @
| 2.3.26 E. v) x5 p; q" q) U# d
| 60950(ed.3), w6 p; R& m4 F* E4 I* p% V
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. p& V$ C( o* q$ s/ h9 ^Standard(s):
% u4 i& p6 q! B+ `4 q8 T. UIEC 60950 (1999) 3rd Ed.
6 Y9 c# P, R, E QSub clause(s):
% T' Z2 p1 c" E/ U7 z& A: `2.3.2
" P3 t+ `& a+ W1 CSheet No.
( }7 P2 t" {( B395
+ T7 q! Z5 U5 O6 B& q' |6 W: OSubject:
4 H+ a8 b& H4 m& E) v+ F6 _) bSeparation of TNV –3 and SELV# z" }7 b' W) P/ _# V- ^
circuitry8 R( p1 i# P& w+ C
Key words:. e m- s! J' Q. _# g2 B
- Separation of TNV-3 circuit
6 s. G9 k- v+ s& d0 ]and SELV circuit) v7 I6 X+ S0 b! b
Decision taken at the 39th
7 t2 y* ]% F* L4 v2 U+ p8 c5 ~/ z% Fmeeting 20025 Y$ \ q# Y6 c& n/ O
Question:8 q6 D' f5 A( y# ^# z
1. Is it permitted to demonstrate that a TNV -3 circuit is adequately separated from a SELV circuit by2 Z3 F @1 q9 M/ z
means of single fault testing, in the situation where the spacings do not meet the requirements for basic
: @* i* x& k2 f! v' i1 o& Tinsulation? (The dielectric strength test is still required under Subclause 6.2.1.)
" I3 \9 |) k1 U& k1 H9 _2. If so, is it required under the compliance paragraph to short circuit the insulation between the TNVcircuit7 Y7 R5 y2 \, G' l- P& d" m+ ^
and the SELV circuit at all points which do not meet the criteria for basic insulation, before) \0 M9 i) H! z" K$ D& g% O
carrying out the tests?. S) L( j1 U: m* f& T- c
3. If short circuiting the insulation before carrying out fault tests results in the equipment passing the tests,+ a7 @9 ^9 \- ~, a! r) d/ @
whereas carrying out the fault tests without short circuiting the insulation would result in the equipment
+ u0 Q4 j' O. _& ^ Y2 S) q% [2 cfailing the test, should the insulation be short circuited?2 U" \* @! ]+ s3 P
Rationale:
' i# Y% a& k/ L9 v" f: Q' C1. Paragraph 1 of Sub-clause 2.3.2 requires that separation between a TNV-3 and a SELV circuit be such2 i# A4 z2 a% f Z& `4 w* u3 `
that in the event of a single fault, the SELV circuit remains below TNV-3 limits. Paragraph 2 of Subclause
, e, g$ [' Y$ l5 y1 p/ @2.3.2 states that basic insulation will achieve this, but other solutions are not excluded.
0 z0 ~" e* l" L. H2 C2 ~Equipment is not required to meet either Paragraph 2 or 3. It can meet the single fault conditions stated
1 ?3 o$ d; ]( i1 |: `; Kin Paragraph one and in the compliance paragraph.
8 i- Y, W# I$ T0 ^2. According to the compliance paragraph, before carrying out the single fault tests, insulation which does
8 H5 t2 \% r; J* xnot meet the requirements for basic insulation is short circuited. Presumably this does not mean that
2 b: N/ q% d7 v) E6 y% dshort circuits are to be applied between all tracks and components in the entire TNV-3 and SELV
5 e7 n8 X$ D+ Z" j5 Ccircuitry which do not meet basic insulation, but that the insulation at the point where the TNV-3 circuit
% E6 n' Q# l! P: T( Q8 o2 Z. Lmeets the SELV circuit is short-circuited.
0 o+ r( {" }& l6 L3 ^* q3. It is possible to envisage a situation where short circuiting the insulation between TNV-3 and SELV
# K; t( }' d7 W. x; _: h3 h9 hcould cause the TNV-3 voltages to be lowered. Fault tests under this condition would not represent the8 y0 B- D1 ?, |1 M$ J
worst case possible fault condition
: O" t9 E( J- u" y* cDecision:( ^, |4 f) J* w% \) p, ~6 K) f
1. It is permitted to demonstrate compliance with Subclause 2.3.2 by means of single fault testing.
( j5 a- ?/ b l# SThe limits in 2.3.1.b) shall not be exceeded in normal or single fault conditions.% y6 }+ T% T( N# L' @
2. Before carrying out single fault testing of components and insulation, insulation between TNV-3 and" o- [* G' c9 C |' c( ?
SELV circuits not meeting the requirements of Basic insulation should be short circuited if this results in, c) R4 `! F' e- P
a worst case voltage measurement at accessible parts of SELV and TNV-1 circuits, and at accessible8 ~8 R4 _7 z) R1 x# I
conductive parts during subsequent fault testing.
( W) b: L1 X3 p1 ]; R3. If the single fault test would be more severe if carried out without short circuiting the insulation, the test: @* w2 o1 {& R& `, A4 a" ^( |
should be done without short circuiting the insulation.
9 E1 h9 G+ _: a; g
6 R# b' C# M3 |) L- Y% D0 y: W* }+ T7 Q* q9 ^1 D: c) D
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