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6 x- f% @% @ i0 b! V( A# J) D | Mains Transformers Overload test( d# R6 {9 t* }( B/ L" y
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' K( `6 a. n. l) z5 _7 _Standard:( E$ @% c$ |1 f8 w( z
IEC 61010-) p: F; k+ _6 F1 L
1:1990+A1:1992+A”:1995: {' p6 o9 V* J& [
Sub clause:
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Subject:! B4 ]! h$ O% C) q2 a5 _* o
Mains transformers
) ~( ^) M m& }/ n. w! }- r2 }Overload test
2 o! o7 R# f8 i7 C; cKey words:
0 f! J' C& f* \" U- Transformer2 P8 W: n: K8 M- u. r+ \2 a- L
- Overload" \0 J0 u/ t* q' s
- Temperature
* M9 l/ I5 C. ]3 g4 A( y' @- m, bDecision taken by- m# x4 r7 J% u2 n* j. R. U
ETF3 and confirmed
9 K9 _/ i3 Q) L# j- R4 vby CTL at its 38th3 r0 n( k; A' i
meeting, in Toronto
, X& y- c/ f8 ^( ] V6 _; z# aQuestion:% O* `8 w( t7 X; r) u5 B; x
Should this test be performed starting from cold condition or from operating temperature?$ }$ Q4 b9 v7 O% u. G
Decision:
% o7 [& b& `+ @: s% Q9 D* PTests from both temperatures are valid and should therefore, be performed if there is8 V5 I/ h2 P% t( {
likelihood that limits will be exceeded.
" n: ^0 M8 I! g; |- @4 ]* UExplanation
% C, [; g4 [ L' K1 jAll working temperatures are addressed by this requirement. Laboratories should analyse the* Y( Q- M$ `( D0 i, y# b
operation of the device to determine whether more than one test is needed.
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