6 r/ c" o+ z4 R17.1 End of lamp life effects & X2 R9 `+ _# |7 V. U
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At the end of lamp life the ballast shall behave in such a way that no overheating of lamp cap(s occurs at any voltage between 90% and 110% of the rated supply voltage.5 |6 X f, l" _) Q
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For the test simulating end of lamp life effects, three tests are described: / i% E! h4 ]) @+ [5 q, U/ `. Aa) asymmetric pulse test (described in 17.2); ' D0 Y; s- d7 N Q5 p4 Zb) asymmetric power dissipation test (described in 17.3); 7 [7 E0 z! D1 S# g2 b5 v) ?c) open filament test (described in 17.4). : i# [" M1 J" l) ` Y2 X g, M) k9 p% U1 ] @# Z! I
Any of the three tests may be used to qualify electronic ballasts. The ballast manufacturer shall determine which of the three tests will be used to test a given ballast based on the design of that particular ballast circuit. The chosen test method shall be indicated in the ballast manufacturer’s literature. : E; A( g" M: f6 o* R6 K% }" P x" |4 z$ N! J, z; z- j
NOTE Checking ballasts against their capability to cope with the partial rectifying effect is recommended by IEC 61195, Annex E, and IEC 61199, Annex H.* O& q; ^( G! W. d
Lamps used in the ballast test circuits shall be new lamps seasoned for 100 h.