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标题: CE标准/EN 55014升级了吗？ [打印本页]
作者: ALICE    时间: 2008-11-25 19:34
标题: CE标准/EN 55014升级了吗？
各位
+ d- W3 G* p6 }$ E- G上周拿一个样机给认证机构做EMC测试，出草稿报告,审核时发现标准中的一条写：EN55014-2：1997+A1：2001+A2：2008.- [$ {2 q  R, L0 r( v
请问，CE的EN55014版本升级了吗？什么时候开始实施？增加的A2主要测试那方面的，是否所有EMC测试都有这要求？请大家告知。谢谢！
作者: Naomi    时间: 2008-11-26 10:46
A2:2008 of EN 55014-2:1997 已經 於 10 月投票通過
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預計於 2011年9月1日起實施
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% n( `* c3 I5 X0 J所以 2008年11月4日公告的 harmonized standards 中並未有此一amemdent !& f& `4 }2 j4 y7 @: s

" P/ C. p* \! l: o  ?至於內容,..... 目前還買不到 法規 ........
作者: andyjiang    时间: 2008-11-26 17:32
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作者: leontong1    时间: 2008-11-27 13:06
如果是报告EN55014-2：1997+A1：2001+A2：2008. 没有问题，
7 W- t! _, s8 }; O& c# G4 [# p但是如果是证书，由于EN55014-2：1997+A1：2001+A2：2008不在oj的harmonized standards 上，所以不能列
作者: ALICE    时间: 2008-11-28 14:17
{預計於 2011年9月1日起实施}??
% \2 Y3 E9 U" u4 I- d( r1 _认证机构再次发报告给我审核把A2:2008删掉了,说现在还没有实施,不可以写,等2009年6月1号实施再加几百元报告费,请问预计实施的真正时间?认证机构的做法合理吗
作者: leontong1    时间: 2008-12-1 11:27
引用第4楼ALICE于2008-11-28 14:17发表的  :
) B& X8 L6 I5 N8 I{預計於 2011年9月1日起实施}??
/ V  `4 b5 X5 ^# u" e7 E! z认证机构再次发报告给我审核把A2:2008删掉了,说现在还没有实施,不可以写,等2009年6月1号实施再加几百元报告费,请问预计实施的真正时间?认证机构的做法合理吗

$ k3 ^9 D+ q& `2 ?" U预计实施的真正时间要等明年的OJ公布，$ W: T# y( x8 R* L' o, G3 W
认证机构的做法是合理的但是没有必要去做，新旧标准有一定时间的过渡期的，过渡期内新旧标准同时合法
作者: Naomi    时间: 2008-12-3 09:20
如果 測試有依據 A2：2008 的話, 報告中肯定可以加上A2：2008
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" b, o' f. Y% o* B. F* `問題是 除了EU會員國外, 有人有 A2:2008 法規嗎? 7 s8 Q# E# [2 M9 u2 P

+ L7 ^1 r8 [* V9 j1 @2011年9月1日 還有2年多, 誰知道那時會不會有新標準!
作者: ALICE    时间: 2008-12-15 09:18
测试机构通知A2：2008是2009.6.1开始实施，希望楼主有相关标准资料，发出参考。EMC经常要用到
作者: kxlaser    时间: 2008-12-17 11:36
预计实施的真正时间要等明年的OJ公布，
9 s. D/ d, x9 \1 a3 i认证机构的做法是合理的但是没有必要去做，新旧标准有一定时间的过渡期的，过渡期内新旧标准同时合法
作者: Naomi    时间: 2008-12-21 15:56
請參考附件
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其中,
7 l. E, X/ Q0 e, u% XDOP : 表示發行日期
7 d3 K. u% \: A" P3 z; V% [通常DoP 之後就可以開始使用  Z# v, C- g  |7 U/ [  [( {7 Y

1 ~" s2 Q8 _$ h$ aDOW :  表示強制日期
% y: ?7 X7 }% |9 V  S在此日期後, 必須使用此版本法規
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2008/12/1 雖然已經確定此版本了
! L6 Z; a& W/ {' a但是尚未發行,  一般也不能使用該版本法規
作者: 2iso    时间: 2009-3-11 08:21
引用第9楼Naomi于2008-12-21 15:56发表的  :
$ s+ c  M, y. B( L8 M* d$ ^請參考附件
+ E* D  B. z" e2 @9 B" W' u  e
! u0 y9 n* t! _9 b其中,9 y' u, k( v9 u* U
DOP : 表示發行日期
$ D$ x3 f, G" K% q0 Y* r8 n通常DoP 之後就可以開始使用
" B& ~6 D+ h) q  M' @5 K9 f- C.......

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可以贴上链结网址吗? 谢谢.
作者: william_hp    时间: 2009-3-13 10:04
有没有附件传上来
作者: daisy_1208    时间: 2009-3-24 20:52
引用第10楼2iso于2009-03-11 08:21发表的  :
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可以贴上链结网址吗? 谢谢.

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: |! z9 ^$ A% F# N: ?7 bhttp://tcelis.cenelec.be/pls/por ... ;p_arg_values=21247
作者: longclever    时间: 2009-6-3 09:46
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作者: louislin    时间: 2009-6-3 10:06
由于我的标准上有公司名字，就不直接贴上了，差异部分如下
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  Z1 b6 V2 q4 ^; Z5 \2 ]Page 9! x( G' e" v9 ^, G# @* x
1 Scope and object& ?/ T1 E& t9 F/ @" ^! {& A! E
Replace the title of this clause by “Scope”6 }6 Z6 `/ U, a. t5 n
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
6 N% H0 a) {5 V5 }8 h, E2 ZPage 11
8 ^, O% N% |+ d* d+ J' g# D2 Normative references
& T8 I+ J. f# t3 u- B5 _Replace the text by the following:% ?, h: |! `, }; W
The following referenced documents are indispensable for the application of this document.  I1 u1 ]1 y; k( v3 m! {
For dated references, only the edition cited applies. For undated references, the latest edition
9 n$ E  K2 @2 i" Xof the referenced document (including any amendments) applies.
3 B8 A+ ~) Y( s7 gIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:; T& o' i' k7 u( i4 ?" X; S- X5 m, E# T8 B
Electromagnetic compatibility
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CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
( R1 M) e) j* J1 _2 n2 ]! X- {IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
; E0 ~# Y/ w% p5 t4 a! d5 p$ j' Bmeasurement techniques – Electrostatic discharge immunity test' T7 s% G/ ]2 f% d5 I2 h0 R. J& I
Amendment 1:1998
- E6 ^5 U' v$ I# |8 W9 h# f2 bAmendment 2:20001% J! U+ i( U! z$ e. }* _
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and% y6 @' I. B" t1 i
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test  s2 H6 M: s" E1 u9 R( B
Amendment 1:20072
6 l+ w9 Z& g: X4 H% V1 _' Q5 @IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
; O% f8 J  h$ A3 q3 D. H2 bmeasurement techniques – Electrical fast transient/burst immunity test; @& F/ G* z) l( \; a
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and  k9 W5 }5 y. S& s5 _) I7 T
measurement techniques – Surge immunity test
( l/ J: @; n+ bIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and2 V8 p7 u9 ~+ ?* e9 C8 J
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
6 s3 ^2 R! M0 {# `0 `( ~fields. ~( S3 X+ |" ~: L
Amendment 1:2004
) C% j: {: G- B5 e! C3 X- E: lAmendment 2:200634 ~2 H, i$ Y+ R) s4 @# ?5 E) Q
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and6 i6 }; ^8 a1 u7 ?9 {9 F3 u  c
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
' w' D. p3 S. D4 x) Y# ~CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
# f" t/ w. F" ]. w+ }electric tools and similar apparatus – Part 1: Emission0 J4 N' }8 \1 ?: I% U
Page 13$ J+ y% B: Q+ J$ J# L
3 Definitions
* t4 ~1 W' b/ s3 rReplace the title of this clause by “Terms and definitions”.
/ d$ K6 R+ L7 g4 T* q* `Replace the first paragraph by the following:
3 P: D6 }/ [* q3 NFor the purposes of this document, the terms and definitions related to EMC and related9 J! q; v. c" l( D0 x
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
% C' I- T2 k. c( g. b) e: nAdd the following new definition:1 z+ J: _3 g6 B: l) O  T
3.18
9 v% [1 M' ^# X6 k' `/ _clock frequency& A: {' W  u: A  E! z4 B& e
fundamental frequency of any signal used in the device, excluding those which are solely
9 Z: p% a' G; h% w! N+ cused inside integrated circuits (IC)
/ K, j4 M2 s8 uNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
1 ]8 `7 Q* {2 T! A) rfrom lower clock oscillator frequencies outside the IC.6 i: X) f6 j, Z- q: y' u  z
___________
4 R- s& H7 @% Z2 G" X4 p  Q/ E5 |1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.$ X: F- g+ p3 X
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.$ S3 z- ?) N* L; K
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.5 J3 N) ~3 V5 F$ j9 A/ b% l' j

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1 ~& }6 Q$ P# p1 I: T: y– 4 – CISPR 14-2 Amend. 2 © IEC:2008. R2 }* {" L# D( U1 Z: j  s
Page 133 H: R$ ]% D$ n
4 Classification of apparatus
" t% u+ @  w1 v4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
" C9 [% T' b) LPage 15
4 `6 K9 m+ b0 s! q9 y3 w5 Tests* K: r( Q, n1 i! k6 m+ d
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
9 c* s! W: H/ O( w  z  i3 pPage 21
- q( M1 k- O/ B7 m, Q5.6 Surges6 X1 l* y3 `7 f: _3 Q
Table 12 – Input a.c. power ports( b  n( l& n, \5 d# Y5 C5 y7 Q
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add. b. F& a2 @4 }9 I% h
"Line-to-Line with 2 Ω Impedance".( o- A* a2 s1 f5 }, @& N" \" d7 J
After Table 12, add the following paragraph as a new second paragraph:( m) H( F8 I0 a3 l+ V
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
9 q. F" o3 g1 x- h* p& cequipment under test, and the negative pulses are applied 270° relative to the phase angle of
, q1 z$ P, q) S2 p5 R/ sthe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
: P$ C3 Z$ G4 k$ d, zgiven in Table 12 are not required.2 K* r! K6 z1 \7 q5 X3 a
5.7 Voltage dips and interruptions
0 e! S2 M8 B+ i' F" uTable 13 – Input a.c. power ports
3 M) W0 S7 i! w! t2 uReplace the existing Table 13 by the following new Table 13:/ N4 Q3 _" r) P
Table 13 – Input a.c. power ports
) o$ c! q5 U% a4 hDurations for voltage dips. Y& V2 u) E( X' o, s) y& G
Environmental Test set-up
6 A) D* b7 V4 A1 V  V+ Hphenomena
% c' U- d/ e/ n6 ^! ^4 |Test level5 g% E3 b4 t" f& m, c6 ~
in % UT; q) K8 }; i9 {! h% d$ x0 g
50 Hz 60 Hz
' b  S' T! f2 ]; e- D$ zVoltage dips" j( X3 [7 h9 ^' q
in % UT3 f7 q# q$ B+ ?( d4 U/ B. z
1000 _; `( J) g- Z1 w
60. B9 v$ o/ \7 O% V) k
30
. v/ U% R6 I$ n0
! Q3 S6 a# H6 Z404 a. @/ G* ]' Z* M7 Y! S
70
0 r5 Q, l" E3 ~0,5 cycle
5 I4 q( v) l& ?10 cycles
6 k; N6 O; u* |25 cycles
# @; S! y, ?, U' r5 D1 g! g0,5 cycle
7 \' R0 Y2 _# _6 \2 o+ O; @12 cycles
" @) y9 Q# ^1 v9 Z! x* n0 J. h6 h30 cycles$ j: `- ^6 J8 ]5 e, {: H" G
IEC 61000-4-11
3 V! j8 C0 q3 G& v7 e$ C8 RVoltage change shall7 i9 V1 `9 [( s- o0 [
occur at zero crossing1 E7 s4 {$ r" j1 `2 Y
UT is the rated voltage of the equipment under test.( w, o9 p) z$ O1 W( e

' s$ N9 M% N7 ]) K) s! p4 q3 D- E. p" F, m$ Y+ C5 i5 @: k7 M
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
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8 Conditions during testing
) ~. z2 @7 {% s* U% Z1 Q8.1 Replace the first paragraph by the following paragraph:6 M1 H+ v" `  e$ h
Unless otherwise specified, the tests shall be made while the apparatus is operated as
! P% U0 @; j$ g" F4 C4 Y' Q* Dintended by the manufacturer, in the most susceptible operating mode consistent with normal4 ]& [5 q1 E7 F6 q, ?' k/ W
use.
9 r. k/ G2 a0 s! f3 m8.4 Delete the second sentence.
3 ?& k2 y2 g7 ]: f4 E, y8.7 Delete this subclause./ E9 ]/ }8 Z& Q
8.8 Renumber this subclause as 8.7
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+ q" x- ^6 x" r4 a  g9 Assessment of conformity4 z& ~$ y5 N; s$ A6 V
9.2 Statistical evaluation- R4 W! k, {1 M4 O
Replace the existing Note by the following:
  u# ^3 T/ m, e1 L# \2 U2 FNOTE For general information on the statistical consideration in the determination EMC compliance, see7 _- e' L$ Z6 o1 n: r, d1 G
CISPR/TR 16-4-3.! p4 [5 K7 M" y2 B$ J5 |
Page 31
4 F8 K2 l6 [) T$ ?/ R10 Product documentation
* I* A# Z7 M$ K3 O! F) o# [+ UDelete this clause.7 z- G$ @* c' {, {( A% I/ B6 y0 D% m
Bibliography8 ]% u# b+ Y$ f( h( P
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
; N0 \( Y7 y" j& w% j; i9 zCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and  X7 X  i7 ?% z) I
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
" @- l# M6 d! e0 z/ rthe determination of EMC compliance of mass-produced products (only available in English)
作者: honglipardon    时间: 2013-6-24 15:18
学习到了~



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