9 D5 C: \+ n. j6 a18.1 Dielectric voltage-withstand4 z" l, U. V; t
18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20. {6 B8 k, ~) p$ Q9 v18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied * C& Y9 G% Y& a; ebetween live parts and accessible non-current-carrying metal parts, including parts accessible only during$ E, ~: s R/ z% Q& L6 _& ^
relamping.( G% ]2 O1 E( X: D% M& O
18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice w* d7 `* p$ O" Q' ^% othe rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at+ x5 ~0 c7 ]- l8 L+ j8 t( `
1.414 times the AC potential denoted above. $ c. g2 I B) a18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required* d6 o$ H! |: n$ f
test value is reached or breakdown occurs. During the test, any switches or other controls shall be in the ( H6 s+ o' E, N7 y, VON position. 9 y7 I' e M- \7 b8 X18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or& c* e& ^5 v) K6 O0 _) h% u, ~8 ? F
decorative parts not likely to become energized shall not be required to be in place. i B* W& ?: M3 _18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can % ?; i3 c: z' A! I A6 v* u# n% Obe damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be2 Y" Q, P$ D2 m5 r4 z% |7 s rearranged for the purpose of the test to reduce the likelihood of solid state component damage while: Q7 U x/ P( i. q retaining the representative dielectric stress on the circuit./ I% U, H2 \- b) @% K2 @
